DDR5 Memory Layout Using Locked RAID for Chipkill Protection

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Solution Overview

Problem

DDR5 memory chips face increased error rates due to on-die SEC parity bits, which increase die area and cost, and existing chipkill protection methods are inefficient for correcting multiple errors.

Innovation Solution

Implementing a Locked RAID (LRAID) system that omits on-die SEC bits and uses RAID parity bits, end-to-end SEC bits, and end-to-end CRC to provide chipkill protection, utilizing a memory controller for SEC operations.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If on-die SEC parity bits are added to DDR5 memory chips, then error correction capability is improved, but die area and cost increase

Engineering Contradiction:
Improveerror correction capabilityVSAvoiddie area
Core Design Contradiction:
ReliabilityVSArea of stationary object

Solution Approach 1:

The patent extracts the SEC functionality from the memory die and relocates it to the memory controller. The memory controller implements SEC logic that operates on data received from multiple dice, thereby providing error correction without requiring additional SEC bits on each memory die. This resolves the contradiction by maintaining error correction capability while eliminating the die area overhead of on-die SEC bits.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent introduces an intermediary layer (the memory controller) that performs SEC operations on data from multiple dice. Instead of each die having its own SEC bits, the memory controller acts as an intermediary that collects data from multiple dice and applies SEC across the combined data set. This intermediary approach provides error correction capability without increasing individual die area.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Reliability

If Reed-Solomon coding is used for chipkill protection, then protection against multiple errors is improved, but computational complexity and efficiency deteriorate

Engineering Contradiction:
Improvechipkill protection capabilityVSAvoidcomputational complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent replaces complex Reed-Solomon coding with simpler, more efficient error correction mechanisms. Specifically, it uses SEC-DAC (Single Error Correction, Double Error Detection) coding and RAID-like parity schemes that are computationally less intensive than full Reed-Solomon decoding. These simpler codes provide adequate chipkill protection without the high computational overhead of Reed-Solomon, thereby reducing device complexity while maintaining reliability.

Inventive Principle:
Principle #27Cheap short-living objects (Disposable)

Solution Approach 2:

The patent changes the error correction parameters from strong Reed-Solomon codes to lighter SEC-DAC and parity-based schemes. By adjusting the error correction capability parameters to match the actual error rates and requirements, the system achieves adequate chipkill protection with reduced computational complexity. The patent optimizes the balance between protection level and processing overhead by selecting appropriate code parameters.

Inventive Principle:
Principle #35Parameter changes

3Reliability

If 10 DDR dice are used with Reed-Solomon parity bits, then chipkill protection is improved, but storage space efficiency deteriorates

Engineering Contradiction:
Improvechipkill protectionVSAvoidstorage space efficiency
Core Design Contradiction:
ReliabilityVSQuantity of substance

Solution Approach 1:

The patent extracts the Reed-Solomon parity storage requirement and replaces it with more space-efficient error correction mechanisms. By moving SEC to the controller and using lighter parity schemes, the system reduces the number of dedicated parity dice needed. This allows better utilization of storage space while maintaining chipkill protection capability.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent merges the functions of data storage and error correction more efficiently. Instead of separating data dice and parity dice as in traditional Reed-Solomon implementations, the system uses RAID-like configurations where parity information is distributed and integrated with data storage. This merging approach improves storage space efficiency by reducing the overhead dedicated to error correction while maintaining protection against chipkill failures.

Inventive Principle:
Principle #5Merging (Combining)

Data Source

PatentUS20260023644A1Locked raid memory devices
Publication Date: 2026.01.22 MICRON TECHNOLOGY INC
  • US20260023644A1 patent drawing
  • US20260023644A1 patent drawing
  • US20260023644A1 patent drawing

AI summary

Methods, memory devices, and systems for utilizing DDR5 DRAM dice without SEC parity bits, while still providing chipkill protection and RAS performance are described. The disclosed devices utilize a solution based upon locked RAID (LRAID) which omits the on-die SEC bits but retains RAS protections including chipkill protections. The system achieves this protection by replacing the Reed-Solomon parity bits with RAID parity bits, CRC bits, end-to-end SEC bits, and an end-to-end CRC. The SEC protection is enabled, in some examples, by a memory controller, such as by an on-ASIC memory controller making this an on-ASIC SEC rather than an on-die SEC.