Decoupling Capacitor Support Structure for High-Aspect Stability

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Solution Overview

Problem

Cell capacitors and decoupling capacitors in DRAM devices have a high aspect ratio, making them prone to falling down, and the support structures are susceptible to damage and cracking.

Innovation Solution

A decoupling capacitor structure is designed with an insulating division pattern, conductive pads, lower electrodes, a support structure, a dielectric layer, and an upper electrode structure, where the support structure contacts the sidewalls of the lower electrodes, connecting them and forming openings between specific electrodes to enhance stability.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If the aspect ratio of cell capacitors and decoupling capacitors is increased, then the capacitor density is improved, but the structural stability deteriorates causing the capacitors to fall down

Engineering Contradiction:
Improvecapacitor densityVSAvoidstructural stability
Core Design Contradiction:
Quantity of substanceVSStability of the object's composition

Solution Approach 1:

The support structure is divided into multiple segments including a first support pattern and a second support pattern, with the second support pattern having openings between adjacent first lower electrodes. This segmentation allows the support structure to provide stability while accommodating the high aspect ratio capacitors without causing them to fall down.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The support structure extends in both first and second directions from the conductive pad, creating a three-dimensional support framework. The first support pattern extends in a first direction while the second support pattern extends in a second direction, providing multi-directional support for the high aspect ratio capacitors.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Stability of the object's composition

If the support structure is made continuous to improve stability, then the capacitors are better supported, but cracks may form in the support structure under external impact

Engineering Contradiction:
Improvesupport structure stabilityVSAvoidcrack resistance
Core Design Contradiction:
Stability of the object's compositionVSReliability

Solution Approach 1:

The support structure is segmented into first and second support patterns with controlled openings, preventing crack propagation while maintaining overall stability. The openings between adjacent first lower electrodes act as crack arrestors, allowing the support structure to withstand external impact without forming continuous cracks.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The support structure is designed with openings and patterns that beforehand cushion and distribute external impact forces. The second support pattern with openings provides a cushioning effect that prevents stress concentration, reducing the likelihood of crack formation under external impact.

Inventive Principle:
Principle #11Beforehand cushioning (Prior cushioning)

3Stability of the object's composition

If the support structure contacts all lower electrodes to maximize support, then structural stability is improved, but the complexity of the support structure increases

Engineering Contradiction:
Improvestructural stabilityVSAvoidsupport structure complexity
Core Design Contradiction:
Stability of the object's compositionVSDevice complexity

Solution Approach 1:

The support structure is segmented into first and second support patterns with specific contact regions. The first support pattern contacts the first lower electrodes while the second support pattern contacts the second lower electrodes, providing stable support without requiring uniform contact with all electrodes, thus reducing complexity.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different regions of the support structure have different contact characteristics. The first support pattern provides support at specific locations while the second support pattern provides support at other locations, creating local quality variations that optimize stability while minimizing overall complexity.

Inventive Principle:
Principle #3Local quality

Data Source

PatentUS12568617B2Decoupling capacitor structure and semiconductor device including the same
Publication Date: 2026.03.03 SAMSUNG ELECTRONICS CO LTD
  • US12568617B2 patent drawing
  • US12568617B2 patent drawing
  • US12568617B2 patent drawing

AI summary

A decoupling capacitor structure includes an insulating division pattern, conductive pads, lower electrode sets, a support structure, a dielectric layer, and an upper electrode structure. The conductive pads are at opposite sides of the insulating division pattern. The lower electrode sets are spaced apart from each other in a horizontal direction on each conductive pad. The support structure contacts and connects sidewalls of the lower electrodes. The dielectric layer is on the lower electrodes and the support structure. The upper electrode structure is on the dielectric layer. The lower electrode sets include first lower electrodes adjacent to the insulating division pattern and second lower electrodes spaced apart from the first lower electrodes in the horizontal direction. The support structure defines an opening between the second lower electrodes. The opening is not formed between the first lower electrodes or between the first lower electrodes the second lower electrodes.