Degradation Detection Circuit for BTI Threshold Voltage Compensation

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Solution Overview

Problem

Semiconductor devices face degradation issues such as bias temperature instability (BTI), which affect their performance and reliability over time, and existing technologies lack effective solutions to detect and compensate for these degradations.

Innovation Solution

A semiconductor apparatus and system that includes a degradation detection circuit and a voltage generator to detect and generate variable bias and gate voltages, compensating for threshold voltage variations in transistors by adjusting these voltages based on detected degradation levels.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If semiconductor devices are operated for extended periods, then productivity increases, but degradation phenomena such as BTI occur causing threshold voltage changes and performance deterioration

Engineering Contradiction:
Improveoperational durationVSAvoiddevice performance
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The patent implements a feedback mechanism where the degradation detection circuit continuously monitors threshold voltage changes in transistors and sends degradation information to the voltage generator. The voltage generator adjusts bias and gate voltages based on this feedback to compensate for degradation, thereby maintaining device performance over extended operational periods

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The patent changes electrical parameters (bias voltage and gate voltage) to compensate for degradation. The voltage generator dynamically adjusts these voltage parameters based on detected degradation levels, counteracting threshold voltage shifts caused by BTI and other degradation phenomena, thus maintaining reliable operation

Inventive Principle:
Principle #35Parameter changes

2Reliability

If degradation detection and compensation circuits are added, then device reliability improves, but device complexity increases

Engineering Contradiction:
Improvedevice performanceVSAvoidcircuit structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The degradation detection circuit serves multiple functions: it detects threshold voltage degradation, generates degradation information, and enables compensation control. The voltage generator also performs multiple roles by generating both normal operating voltages and compensation voltages based on degradation levels, reducing the need for separate dedicated compensation circuits

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The semiconductor device performs self-diagnosis and self-compensation. The degradation detection circuit automatically monitors the device's own transistor characteristics, and the voltage generator automatically adjusts voltages to compensate for detected degradation, eliminating the need for external monitoring and adjustment systems

Inventive Principle:
Principle #25Self-service

Data Source

PatentUS11081205B2Semiconductor apparatus for compensating for degradation and semiconductor system using the same
Publication Date: 2021.08.03 MIMIRIP LLC
  • US11081205B2 patent drawing
  • US11081205B2 patent drawing
  • US11081205B2 patent drawing

AI summary

A semiconductor apparatus may include a degradation detection circuit and a circuit block. The degradation detection circuit may detect a degradation occurred in a semiconductor apparatus and generate degradation information. The circuit block may include at least one transistor configured to receive a variable bias voltage and a variable gate voltage.