Demagnification X-ray Optics for High-Intensity Microbeams
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Solution Overview
Problem
Current X-ray diffraction systems face limitations in producing a small-sized X-ray beam with sufficient intensity, as apertures can only reduce beam size but not intensity effectively, and using a micro-focus tube with focusing optics results in only slightly increased brightness.
Innovation Solution
Combining a high brightness rotating anode generator with demagnification X-ray optics and strategically placing apertures to reduce beam divergence and size, while using slits to remove scattered radiation, allows for the creation of a small-sized, high-intensity beam.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Area of moving object
If apertures are used to reduce beam size, then the beam size is reduced, but the beam intensity is also reduced
Solution Approach 1:
The patent changes the optical parameters of the X-ray system by using demagnification optics with specific focal length ratios (f2/f1 < 1) to reduce the beam size while maintaining intensity. This involves adjusting the magnification parameter M = f2/f1 to achieve demagnification, fundamentally changing how the beam is focused compared to conventional systems where M > 1
Solution Approach 2:
The patent inverts the conventional approach by using demagnification instead of magnification. While traditional X-ray optics enlarge the source image to illuminate the sample, this patent reduces the source image size through demagnification, achieving small beam sizes without the intensity loss associated with aperture reduction
2Illumination intensity
If a micro-focus tube with focusing optics is used, then beam brightness is slightly increased, but beam size cannot be reduced sufficiently
Solution Approach 1:
The patent changes the magnification parameter from conventional values (M > 1) to demagnification values (M < 1) by selecting optics with focal lengths where f2 < f1. This parameter inversion allows the system to achieve both small beam sizes and high brightness simultaneously, overcoming the limitations of micro-focus tubes
Solution Approach 2:
The patent makes the X-ray optical system universally applicable to both conventional and demagnification configurations. By designing the optical system to operate with M < 1, it can serve multiple functions: producing small beams for micro-diffraction while maintaining high intensity, and potentially adapting to different source types including rotating anodes and micro-focus tubes
3Area of moving object
If apertures are placed close to the image focal point to reduce beam size, then smaller beams are achieved, but the minimum beam size is limited by beam divergence
Solution Approach 1:
The patent performs preliminary demagnification of the source image before the beam reaches the sample position. By using optics with M < 1, the beam is pre-conditioned to a smaller size with reduced divergence, allowing apertures to achieve even smaller sizes without hitting the divergence-limited minimum that plagues conventional systems
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables the generation of beams with sizes smaller than 0.1 mm while maintaining high flux, superior to conventional methods that suffer from reduced intensity with smaller beam sizes.
Implementation Method 1
an X-ray beam is generated by an X-ray tube with a stationary anode, by a conventional rotating anode X-ray source
Implementation Method 2
an X-ray beam is generated by an X-ray tube with a stationary anode, by a conventional rotating anode X-ray source
Implementation Method 3
a multi-layer focusing X-ray optic 202 is used. Optic 202 has a focusing surface that is part of an ellipse
Implementation Method 4
Optic 202 has a focusing surface that is part of an ellipse, schematically shown as 204 in FIG. 2. An X-ray source 206 is placed at a first focal point of optic 202
Implementation Method 5
X-ray image size is made smaller by placing apertures in-between the X-ray optic and image focal point
Implementation Method 6
using slits to remove scattered radiation
Implementation Method 7
A goniometer and stage 110 are used to establish and manipulate geometric relationships between the incident X-ray beam 108, the crystal sample 112 and the X-ray detector 114
Implementation Method 8
When the X-rays strike the sample, they are diffracted according to the atomic structure of the sample
Implementation Method 9
When the X-rays strike the sample, they are diffracted according to the atomic structure of the sample
Data Source
AI summary
In an X-ray diffraction apparatus, a high brightness source, such as a rotating anode generator, is combined with demagnification X-ray optics to produce a beam with small image size and high-intensity. In one embodiment, an elliptical X-ray optic is positioned relative to the source and image focal points so that the magnification of the optic is less than one. The combination can produce high-intensity beams with beam images at the sample of less than 0.1 mm.