Detachable Electron Microscope Container With Membrane Seal
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Solution Overview
Problem
Conventional electron microscopes are limited in examining samples at ambient pressure due to their vacuum environment requirement, necessitating fixed examination containers that increase costs and restrict adaptability to various samples and purposes.
Innovation Solution
A detachable examination container with a carrier stage and membrane configuration allows for flexible adaptation to different samples and examination purposes by enabling electron beam penetration through sealed troughs, accommodating various samples and environments within an electron microscope's vacuum chamber.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If fixed structure examination containers are used, then sealing and vacuum compatibility are ensured, but adaptability to various samples and examination purposes deteriorates
Solution Approach 1:
The examination container is divided into separable components: a container body and a detachable cover assembly. The cover assembly can be removed and replaced independently, allowing different covers to be used with the same container body for different examination purposes while maintaining sealing integrity through standardized connection interfaces.
Solution Approach 2:
The container body is designed as a universal base that can accommodate multiple types of covers through standardized connection structures. This allows a single container body to serve multiple examination purposes by simply changing the cover, thereby improving adaptability without sacrificing the reliable sealing provided by the standardized interface.
2Measurement precision
If different types of examination containers are prepared for different samples, then examination quality is improved, but examination cost increases
Solution Approach 1:
By separating the container into a reusable body and interchangeable cover assemblies, the system allows examination quality to be optimized for different sample types through specialized covers while the main container body is reused across multiple examinations, thereby reducing the overall quantity of materials needed and lowering costs.
Solution Approach 2:
The detachable cover assembly can be discarded or replaced after use, while the expensive container body is recovered and reused for subsequent examinations. This strategy maintains high examination quality through purpose-specific covers while reducing costs by recovering and reusing the main container structure.
3Ease of manufacture
If fixed examination containers are used, then manufacturing simplicity is maintained, but operational flexibility deteriorates
Solution Approach 1:
The container is manufactured as separate modular components (body and cover assembly) with standardized connection interfaces. This segmentation allows each component to be manufactured using simple, standardized processes while enabling operational flexibility through the ability to detach and reconfigure the cover assembly for different examination needs.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration enhances examination quality and adaptability, reducing costs by allowing the same container to be used for diverse samples and purposes, while maintaining effective sealing and signal reception.
Implementation Method 1
an electron beam can pass the first through-hole and the second through-hole
Data Source
AI summary
An examination container includes a main body, a cover and a carrier stage. The main body has an accommodating trough for holding a sample. The cover is detachably connected to the main body to close the accommodating trough. The cover has a first through-hole penetrating through an outer surface and an inner surface of the cover, and includes a membrane arranging on the inner surface of the cover. The membrane has a second through-hole opposite to the first through-hole for passing an electron beam through the first through hole and the second through hole. The carrier stage is installed in a position corresponding to the second through-hole. The carrier stage is detachably arranged in the accommodating trough for a variety of examination purposes. An electron microscope using the abovementioned examination container is also disclosed.