Detecting Circuit for Display Panel Short Circuit Identification
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Solution Overview
Problem
Conventional display panel testing methods fail to detect short circuits between charging and charge sharing scan lines effectively during the TFT manufacturing process, leading to decreased production yield.
Innovation Solution
A detecting circuit comprising multiple transistor sets and detecting lines that allow for precise detection of abnormalities by controlling the status of first and second transistors through control lines, enabling the identification of short circuits between scan lines.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If scan lines with odd or even sequence numbers are short-circuited at outside of the display panel using conventional methods, then short circuits in the display panel can be detected, but short circuits between charging and charge sharing scan lines of the same line cannot be detected
Solution Approach 1:
The invention divides the detection function into multiple segments: multiple detecting lines (first, second, third detecting lines) are used to detect different scan lines separately. Each detecting line is coupled to specific scan lines through transistor sets, allowing independent detection of charging scan lines and charge sharing scan lines, thereby enabling detection of short circuits between them.
Solution Approach 2:
The invention introduces transistor sets as intermediary components between the detecting lines and scan lines. These transistor sets act as switches that can be controlled to connect or disconnect specific scan lines from detecting lines, enabling precise control over the detection process and allowing detection of short circuits that would otherwise be undetectable by conventional methods.
2Measurement precision
If multiple detecting lines and transistor sets are used to detect short circuits between charging and charge sharing scan lines, then detection precision is improved, but device complexity increases
Solution Approach 1:
The transistor sets serve multiple functions: they act as switches for connecting detecting lines to scan lines, as control elements for selecting which scan lines to detect, and as part of the detection circuitry itself. This multi-functionality reduces the need for separate components for each function, thereby managing complexity while maintaining high detection precision.
Solution Approach 2:
The invention adds a control dimension by introducing control lines that control the transistor sets. This allows the detection circuit to be dynamically configured - the same hardware can detect different scan lines at different times by controlling the transistor states, effectively increasing the detection capability without proportionally increasing hardware complexity.
Data Source
AI summary
A detecting circuit comprises a first to a third detecting line, a first and a second control line, and a first to a sixth transistor set. Each transistor set comprises a first and a second transistor, a control terminal thereof couples to the first and the second control line, respectively, a first terminal thereof couples to one of the first to the third detecting line, a second terminal thereof couples to the second terminal of the second transistor in the same transistor set. The connection nodes compose a dot set [(3,3), (2,2), (3,1), (2,3), (3,2), (2,1)], wherein the numerals 1-3 represent the first to the third detecting line, a first and a second numeral of a dot represent that a first terminal of the first and the second transistor connect to the detecting lines represented by the numerals, respectively.