Device Malfunction Evaluation via Noise Signal Frequency Analysis
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Solution Overview
Problem
Conventional methods for evaluating electric circuits fail to identify the causes of malfunctions in devices comprising multiple electric circuits, as they only provide results for the circuit itself and not the entire device.
Innovation Solution
A method that involves finding the first malfunction frequency property for individual electric circuits and a second malfunction frequency property for the entire device, using DPI tests, S-parameter measurements, and equivalent circuit analysis to determine the critical noise signals causing malfunctions, allowing for the evaluation of semiconductor integrated circuit arrangements on a system board.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional DPI tests are performed on individual electric circuits, then the malfunction frequency property of each circuit can be obtained, but the causes of malfunctions in the entire device cannot be evaluated
Solution Approach 1:
The evaluation process is segmented into two levels: individual circuit evaluation (first malfunction frequency property) and device-level evaluation (second malfunction frequency property). This segmentation allows obtaining detailed circuit-level data while also achieving comprehensive device-level assessment through the combination of individual properties and equivalent circuit analysis.
Solution Approach 2:
The patent combines the first malfunction frequency properties of multiple individual circuits with the equivalent circuit characteristics to derive the second malfunction frequency property for the entire device. This merging process integrates component-level data into a system-level evaluation, enabling comprehensive malfunction cause analysis.
2Ease of manufacture
If only individual circuit evaluation is performed, then test procedures are simple, but comprehensive device malfunction analysis is not possible
Solution Approach 1:
The patent performs preliminary evaluation of individual circuits to obtain their malfunction frequency properties before conducting the device-level equivalent circuit analysis. This preliminary action simplifies the overall process by preparing component-level data in advance, which is then used in the subsequent device-level evaluation to ensure reliability.
Solution Approach 2:
The equivalent circuit serves as an intermediary between individual circuit evaluations and device-level malfunction analysis. It translates component-level malfunction frequency properties into system-level evaluation results, maintaining both procedural simplicity and evaluation reliability through this intermediate representation.
Data Source
AI summary
A method for evaluating a device including a plurality of electric circuits has: a step of finding a first malfunction frequency property for individual electric circuits included in the device, the first malfunction frequency property representing the magnitude of a critical noise signal at which each electric circuit causes a malfunction; and a step of finding a second malfunction frequency property based on the first malfunction frequency property found for each of the electric circuits, an equivalent circuit of the entire device, and an equivalent circuit of each of the electric circuits, the second malfunction frequency property representing the magnitude of a critical noise signal at which the entire device causes a malfunction.