Radiofrequency Circuit Testing TRIZ Cases
- Crystal Oscillator Amplifier BIST for Transconductance Testing
Internal current mirror, ADC, and DAC circuitry estimate crystal oscillator amplifier transconductance without external test hardware.
- Crystal Oscillator Amplifier Self-Test Using Current Mirror Bias Codes
Current mirror, ADC, and DAC bias-code testing estimates crystal oscillator amplifier transconductance without external hardware, cutting test time.
- Launcher-in-Package RF Testing Using Through-Board Waveguide Loopback
A two-stage loop-back test correlates sample RF-accurate data with fast PCB waveguide fixtures to cut mmWave package test cost and setup time.
- Multi-Panel User Equipment Testing with Fixed Probes for Spherical Coverage
Fixed orthogonal probes and a rotating DUT simplify four-downlink testing for spherical coverage while reducing chamber space and test time.
- MOSFET Gate Oxide Defect Detection Through MOS Capacitor Decay
Voltage decay measurements reveal tiny gate-oxide leakage in RF MOSFETs, overcoming standard-current swamping for earlier defect detection.
- On-Chip Test Circuit for RFIC Millimeter-Wave Testing
An on-chip test circuit generates high-frequency signals using low-frequency control to measure RFIC performance.
- Sliding Contact Pin Device for Fine Pitch Semiconductor Testing
A connector pin device uses sliding contact pins within a flexible insulating socket to maintain stable electrical connections.
- Compact Range Reflector Antenna Testing System
A parabolic CR reflector maps far-field patterns to a near-field plane, enabling accurate antenna evaluation in limited laboratory space.
- RF Probe Interface with Capacitive Compensation for Signal Loss
An interface with a capacitive element forms a compensation network to reduce signal reflections and losses at the RF probe connection.
- Modular RF Measuring Device With Interchangeable Sub-Modules
Interchangeable sub-modules in a radio frequency measuring device allow independent updates, reducing hardware replacement costs while maintaining performance.
- Oscillating Crystal Test Equipment Resonance Verification
Automatic test equipment excites oscillating crystals at predetermined resonance frequencies to verify mounting and functionality.
- RF Probe Mismatch Compensation in Conductive Signal Testing
RF vector signal transceiver generates test signals at multiple frequencies to isolate and compensate for power loss caused by probe mismatch.
- Near-Field Electronic Component Testing Apparatus for Wireless Devices
A socket-based testing apparatus positions a test antenna near a device antenna to capture radio waves in the near-field region.
- Low-Profile Slide Screw Tuner for Millimeter-Wave On-Wafer Testing
Rotating disc probe eliminates mechanical conflicts with microscope, expanding tuning range up to 110 GHz.