RF Probe Mismatch Compensation in Conductive Signal Testing
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Solution Overview
Problem
Current wireless device test systems face inefficiencies due to power loss caused by RF signal probe mismatches during conductive signal testing, leading to longer test times and increased costs, as existing methods require reconfiguration and do not accurately account for additional signal losses resulting from mechanical degradations in probe connections.
Innovation Solution
A system and method using a RF vector signal transceiver to generate and process RF signals at multiple frequencies, allowing for the isolation and compensation of power losses due to mismatches between the RF signal probe and the DUT connection by computing net signal magnitudes after accounting for predetermined path losses, thereby maintaining the DUT testing configuration and avoiding the need for additional equipment.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional test systems use conductive signal testing with RF signal probes, then signal path loss can be measured, but power loss due to probe mismatch is not accurately accounted for, leading to testing inaccuracies
Solution Approach 1:
The patent segments the signal path into distinct components: the conductive signal path with known predetermined loss and the RF signal probe connection with unknown mismatch loss. By injecting test signals and measuring reflected signals, the system separately characterizes the probe mismatch loss from the overall signal path loss, enabling accurate compensation for probe-induced power losses during DUT testing.
2Measurement precision
If test systems reconfigure RF signal connections to determine signal path loss and probe mismatch, then measurement accuracy improves, but test time increases and productivity decreases
Solution Approach 1:
The patent performs preliminary characterization of the RF signal probe mismatch loss by injecting test signals and measuring reflected signals before actual DUT testing begins. The measured probe mismatch loss is stored and subsequently used to compensate for power losses during routine DUT testing, eliminating the need to reconfigure connections or repeat measurements for each device tested, thus maintaining high productivity while ensuring measurement accuracy.
3Ease of operation
If mechanical probe connections are used for conductive signal testing, then ease of operation improves, but signal path stability deteriorates due to mechanical degradations
Solution Approach 1:
The patent implements a feedback mechanism where the system continuously monitors the reflected signals from the RF signal probe and uses this information to calculate and compensate for mismatch losses. By measuring the actual signal characteristics and comparing them against expected values, the system dynamically adjusts for variations caused by mechanical degradations in probe connections, maintaining signal path stability without requiring physical reconfiguration or replacement of connectors.
Data Source
AI summary
System and method for compensating for power loss due to a radio frequency (RF) signal probe mismatch in conductive RF signal testing of a RF data signal transceiver device under test (DUT). Sourcing the RF test signal with the RF vector signal transceiver at multiple test frequencies enables isolation of and compensation for power loss due to a mismatch between the RF signal probe and RF DUT connection based on predetermined losses of the RF signal path.