Near-Field Electronic Component Testing Apparatus for Wireless Devices

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Solution Overview

Problem

Current electronic component testing methods for wireless devices are limited in their ability to perform Over The Air (OTA) tests in near-field settings, which are necessary for accurate radiation performance characterization.

Innovation Solution

The development of an electronic component testing apparatus that includes a socket system with a test antenna and a base, allowing for the transmission and reception of radio waves between the device antenna and the test antenna in a near-field configuration, utilizing attenuation members and shield layers to optimize the testing process.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a far-field anechoic chamber is used for OTA testing, then measurement accuracy for radiation performance is improved, but the testing setup becomes complex and time-consuming

Engineering Contradiction:
Improveradiation performance measurement accuracyVSAvoidtesting setup complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent introduces a near-field testing apparatus as an intermediary solution between the device under test and the far-field anechoic chamber. This apparatus includes a test antenna positioned close to the device antenna, allowing OTA measurements to be performed in the near-field region. The near-field apparatus acts as a mediator that captures radiation characteristics without requiring the complex far-field environment, thus reducing testing setup complexity while maintaining measurement accuracy for radiation performance

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent changes the measurement parameter from far-field conditions to near-field conditions. By performing OTA testing in the near-field region where electromagnetic fields have not yet fully propagated, the system can obtain radiation performance data without requiring the large distances and anechoic chamber environments of far-field testing. This parameter change fundamentally simplifies the testing setup while preserving the ability to measure radiation characteristics

Inventive Principle:
Principle #35Parameter changes

2Productivity

If a near-field testing apparatus is used, then testing time and setup complexity are reduced, but measurement accuracy may deteriorate

Engineering Contradiction:
Improvetesting efficiencyVSAvoidradiation performance measurement accuracy
Core Design Contradiction:
ProductivityVSMeasurement precision

Solution Approach 1:

The patent replaces the mechanical far-field testing system with an electromagnetic near-field testing system. Instead of physically positioning the device far from the test antenna in an anechoic chamber, the system uses near-field electromagnetic coupling to achieve the same measurement objective. This substitution maintains measurement accuracy by utilizing the electromagnetic field characteristics in the near-field region, while dramatically improving testing efficiency by eliminating the need for large facilities and complex positioning

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Measurement precision

If the device antenna is positioned close to the test antenna, then near-field interaction is achieved, but interference and signal quality may worsen

Engineering Contradiction:
Improvenear-field OTA test accuracyVSAvoidradio wave interference
Core Design Contradiction:
Measurement precisionVSObject-affected harmful factors

Solution Approach 1:

The patent introduces dynamic positioning and adjustment mechanisms that allow the test antenna to be precisely positioned at optimal distances from the device antenna. The system can dynamically adjust the separation distance and orientation to achieve the desired near-field interaction while minimizing interference. This dynamic control enables the system to maintain measurement accuracy by optimizing the electromagnetic coupling conditions in real-time

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent incorporates feedback mechanisms that monitor the quality of radio wave interaction between the device antenna and test antenna. By measuring parameters such as signal strength, impedance matching, and standing wave ratio, the system provides feedback to adjust the positioning and configuration of the test antenna. This feedback loop ensures that near-field interaction is maintained at optimal levels, maximizing measurement accuracy while minimizing harmful interference effects

Inventive Principle:
Principle #23Feedback

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables accurate OTA testing of wireless devices by positioning the device and test antennas for near-field radio wave interaction, improving testing accuracy and reducing interference, while also allowing for the evaluation of both radiation and reception characteristics.

Implementation Method 1

The tester tests the DUT by transmitting and receiving radio waves between the device antenna and the test antenna

Methodology Applied
Scientific EffectRadio wave transmission and reception: Electromagnetic Induction

Implementation Method 2

the second socket may include a first attenuation member which attenuates radio waves radiated from the device antenna or the test antenna

Methodology Applied
Scientific EffectRadio wave attenuation: Absorption (EM radiation)

Data Source

PatentUS12025654B2Electronic component testing apparatus, sockets, and replacement parts for electronic component testing apparatus
Publication Date: 2024.07.02 ADVANTEST CORP
  • US12025654B2 patent drawing
  • US12025654B2 patent drawing
  • US12025654B2 patent drawing

AI summary

An electronic component testing apparatus for testing a device under test (DUT) includes: a socket unit that is electrically connected to the DUT; a first wiring board that includes a board opening; and a tester that includes a test head in which the first wiring board is mounted. The socket unit includes a first socket that faces a first main surface of the DUT and is electrically connected to the DUT and the first wiring board. The second socket that is exposed from the first wiring board through the board opening, contacts a second main surface of the DUT on a side opposite to the first main surface, and includes: a base that contacts the second main surface; and a test antenna unit that is electrically connected to the tester and faces a device antenna unit of the DUT.