Diagnostic Abort Circuit for Semiconductor Self-Diagnosis
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Solution Overview
Problem
Existing semiconductor devices face instability due to abrupt changes in current consumption when the self-diagnostic process is discontinued, leading to fluctuations in power supply voltage and unstable operation.
Innovation Solution
Incorporating a Diagnostic abort control circuit that stops the self-diagnostic process in a stepwise manner when a stop signal is received, gradually reducing the test clock signal frequency and power consumption to prevent sharp changes in current consumption.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Speed
If the self-diagnostic process is immediately stopped when a stop signal is received, then the response time to external commands is improved, but the current consumption changes abruptly causing power supply voltage fluctuations and operational instability
Solution Approach 1:
The patent applies dynamics by transitioning the self-diagnostic circuit from immediate static stopping to dynamic gradual stopping. The Diagnostic abort control circuit gradually reduces the operation of pattern generation circuits over a predetermined period when receiving a stop signal, making the current consumption change gradual rather than abrupt, thereby preventing power supply voltage fluctuations and maintaining operational stability.
Solution Approach 2:
The patent implements beforehand cushioning by introducing a predetermined period transition phase before completely stopping the self-diagnostic process. During this transition period, the pattern generation circuits are gradually reduced rather than immediately stopped, cushioning the impact on current consumption and preventing abrupt changes that would cause power supply voltage fluctuations.
2Productivity
If multiple pattern generation circuits operate simultaneously during self-diagnosis, then the diagnosis speed is improved, but the current consumption becomes too high and changes sharply when stopped
Solution Approach 1:
The patent applies segmentation by dividing the pattern generation circuits into multiple independent units that can be controlled individually. The Diagnostic abort control circuit stops these segmented circuits at different timings during the transition period, allowing the diagnosis function to be maintained with reduced current consumption while avoiding sharp changes when the self-diagnostic process is discontinued.
Solution Approach 2:
The patent implements periodic action by operating multiple pattern generation circuits at different timings during the transition period. Instead of stopping all circuits simultaneously, the control circuit gradually reduces their operation in a staged manner, maintaining diagnostic functionality while managing current consumption levels and preventing abrupt changes.
Data Source
AI summary
A semiconductor device capable of suppressing a sharp change in current consumption and a self-diagnosis control method thereof are provided. According to one embodiment, the semiconductor device 1 includes a logic circuit, which is a circuit to be diagnosed, a self-diagnostic circuit for diagnosing the logic circuit, and a diagnostic control circuit for controlling the diagnosis of the logic circuit by the self-diagnostic circuit, and the diagnostic control circuit includes a diagnostic abort control circuit for gradually stopping the diagnosis of the logic circuit by the self-diagnostic circuit when the semiconductor device receives a stop signal instructing the stop of the diagnosis of the logic circuit by the self-diagnostic circuit.