Single-Crystal Diamond Inclusion Mapping for Tool Intermediate Extraction
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Solution Overview
Problem
Current methods for inspecting inclusions in single-crystal diamonds, such as visual inspection with optical microscopes, are inefficient due to the large refractive index of diamonds, leading to difficulties in precisely specifying inclusion positions and determining suitable shapes for diamond tool intermediates, which affects yield and tool performance.
Innovation Solution
A method involving X-ray imaging, where a single-crystal diamond is fixed to a support with a specific facet plane, allowing for precise specification of inclusion positions and determination of extractable shapes for diamond tool intermediates, using X-ray CT apparatus to associate crystal orientation with X-ray emission direction, and extracting shapes that meet predetermined inclusion-excluded region criteria.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If visual inspection with optical microscopes is used to inspect inclusions in single-crystal diamonds, then the inspection process is simple and equipment cost is low, but the precision of inclusion position specification is poor and processing time is long
Solution Approach 1:
The patent replaces the optical microscope-based visual inspection system with an X-ray CT imaging system. This substitution enables precise three-dimensional localization of inclusions within the diamond crystal by using X-ray attenuation differences to detect and map inclusion positions, thereby resolving the contradiction between measurement precision and device complexity.
Solution Approach 2:
The patent changes the inspection parameter from optical wavelength to X-ray wavelength. By using X-rays with higher energy and shorter wavelength, the system achieves superior penetration and contrast for detecting inclusions deep within the diamond, significantly improving measurement precision compared to optical methods.
2Productivity
If visual inspection with optical microscopes is used to determine extractable shapes, then the method is simple, but the yield of diamond tool intermediates is low and processing time is long
Solution Approach 1:
The patent performs preliminary three-dimensional mapping of inclusion positions using X-ray CT imaging before the diamond cutting process. By pre-identifying all inclusion locations and their three-dimensional coordinates, the system enables optimized extraction of inclusion-free zones, maximizing the yield of usable diamond tool intermediates and reducing processing time through automated shape determination.
Solution Approach 2:
The patent creates a three-dimensional digital copy or model of the diamond's internal inclusion structure through X-ray CT scanning. This digital replica allows for virtual simulation and optimization of extraction shapes before actual processing, enabling precise determination of extractable regions and improving both yield and efficiency.
3Manufacturing precision
If inclusion positions are not precisely specified, then the inspection process is simpler, but the determination of suitable shapes for diamond tool intermediates is inaccurate
Solution Approach 1:
The patent transitions from two-dimensional surface inspection to three-dimensional internal imaging by employing X-ray CT technology. This dimensional advancement enables precise specification of inclusion positions throughout the entire volume of the diamond crystal, providing accurate spatial coordinates (x, y, z) that are essential for determining suitable extraction shapes with high manufacturing precision.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This method improves the precision of inclusion position specification and shape determination, enhancing the yield of diamond tool intermediates by accurately associating crystal orientation and shape, and reducing processing time while ensuring desired properties are met.
Implementation Method 1
An X-ray image of the single-crystal diamond is captured, the X-ray image being an X-ray image in which a crystal orientation of the single-crystal diamond is associated with an X-ray emission direction
Data Source
AI summary
A single-crystal diamond having a first facet plane is prepared. The single-crystal diamond is fixed to the support based on the first facet plane. An X-ray image of the single-crystal diamond is captured, the X-ray image being an X-ray image in which a crystal orientation of the single-crystal diamond is associated with an X-ray emission direction by associating the support to which the single-crystal diamond is fixed with the X-ray emission direction. A position of an inclusion of the single-crystal diamond in the single-crystal diamond is specified based on the X-ray image. It is determined whether or not a shape of the diamond tool intermediate is extractable from the single-crystal diamond with the inclusion being not included in an inclusion-excluded region. The shape of the diamond tool intermediate is extracted from the single-crystal diamond with the inclusion being not included in the inclusion-excluded region.