Diamond Nanostructure Mass Spectrometry at Room Temperature

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Solution Overview

Problem

Existing mass spectrometers, such as MALDI-TOF and NEMS devices, face limitations in accurately measuring the mass of larger analytes due to limited measurement ranges and temperature-dependent mechanical properties, respectively.

Innovation Solution

A nanostructure-based mass spectrometer using a diamond material with a tapered design, capable of measuring mass at room temperature by analyzing secondary electron signals from electron beam interactions, allowing for accurate mass measurement regardless of analyte adsorption position.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a NEMS device with silicon or carbon nanotube nanostructure is used for mass measurement, then the measurement sensitivity is improved, but the mechanical properties become temperature-dependent requiring low temperature operation

Engineering Contradiction:
Improvemass measurement sensitivityVSAvoidoperating temperature requirement
Core Design Contradiction:
Measurement precisionVSTemperature

Solution Approach 1:

The patent changes the material parameter from conventional silicon or carbon nanotube to diamond, which fundamentally alters the temperature dependence of mechanical properties. Diamond's unique crystal structure provides thermal stability that maintains mechanical properties across a wide temperature range, eliminating the need for low temperature operation while preserving high measurement sensitivity

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent employs diamond as a composite nanostructure material that combines the desired mechanical sensitivity with thermal stability. The diamond nanostructure integrates both the mass sensitivity required for precise measurement and the thermal properties needed for room temperature operation, resolving the contradiction between sensitivity and temperature requirements

Inventive Principle:
Principle #40Composite materials

2Quantity of substance

If the size of the analyte increases to extend measurement range, then more mass cases can be measured, but the number of cleaved material cases increases making accurate mass specification difficult

Engineering Contradiction:
Improvemeasurement rangeVSAvoidmass specification accuracy
Core Design Contradiction:
Quantity of substanceVSMeasurement precision

Solution Approach 1:

The patent replaces the conventional MALDI-TOF mechanical ionization and time-of-flight measurement system with a direct mechanical resonance frequency measurement system using diamond nanostructures. This substitution allows for direct mass measurement through frequency analysis (f = (1/2π)√(k/m)), eliminating the need for peptide cleavage and fingerprinting techniques, thereby maintaining high mass specification accuracy across an extended measurement range

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Adaptability or versatility

If conventional MALDI-TOF mass spectrometer is used, then proteins can be identified using peptide mass fingerprinting, but the measurement range is limited to 1 kDa to 500 kDa

Engineering Contradiction:
Improveprotein identification capabilityVSAvoidmeasurement range
Core Design Contradiction:
Adaptability or versatilityVSQuantity of substance

Solution Approach 1:

The patent creates a universal mass measurement platform using diamond nanostructures that can measure a wide range of masses from small molecules to large proteins and complexes. The system maintains the ability to identify proteins through direct mass measurement while extending functionality to cover masses beyond the conventional 500 kDa limit, making it applicable to diverse analytes including intact proteins, protein complexes, and large biomolecules

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables accurate mass measurement of analytes over a wide range, from several MDa to several GDa, with high precision and stability, independent of adsorption position, and without the need for low temperatures.

Implementation Method 1

an electron beam generator configured to irradiate the nanostructure with an electron beam; a secondary electron detection unit configured to detect a secondary electron signal emitted by an interaction of the electron beam with the nanostructure

Methodology Applied
Scientific EffectSecondary electron emission: Electron Impact Desorption

Implementation Method 2

a substrate disposed inside the chamber and having at least one nanostructure formed thereon, to which the analyte input by the analyte input unit is adsorbed

Methodology Applied
Scientific EffectAdsorption: Adsorption

Data Source

PatentUS20250210333A1Apparatus and method for mass spectrometry using nanostructure
Publication Date: 2025.06.26 KOREA INST OF SCI & TECH
  • US20250210333A1 patent drawing
  • US20250210333A1 patent drawing
  • US20250210333A1 patent drawing

AI summary

Disclosed herein is an apparatus and method for mass spectrometry using a nanostructure that enables measuring mass of an analyte in room temperature. The apparatus may include: a chamber providing a space in which mass spectrometry is performed; an analyte input unit configured to input an analyte into the chamber; a substrate disposed inside the chamber and having at least one nanostructure formed thereon, to which the analyte input by the analyte input unit is adsorbed; an electron beam generator configured to irradiate the nanostructure with an electron beam; a secondary electron detection unit configured to detect a secondary electron signal emitted by an interaction of the electron beam with the nanostructure; and a mass measurement unit configured to identify a vibrational state of the nanostructure and measure a mass of the nanostructure through frequency analysis of the detected secondary electron signal.