Digital Delay Locked Loop With Segmented Phase Detection

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Solution Overview

Problem

Digital delay locked loops face limitations in reducing the maximum static phase offset due to a large detection window size, which is influenced by process voltage temperature (PVT) variations, leading to inferior jitter performance compared to analog loops.

Innovation Solution

A digital delay locked loop design that generates multiple delay signals with different phases, divides the detection window into finer areas, and uses phase synthesizing and detection parts to generate control codes, allowing for precise phase adjustment and reduced static phase offset.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If the detection window size is increased to account for PVT variations, then the reliability of locking the reference signal is improved, but the maximum static phase offset increases

Engineering Contradiction:
Improvelocking reliabilityVSAvoidphase offset
Core Design Contradiction:
ReliabilityVSMeasurement precision

Solution Approach 1:

The detection window is divided into multiple sub-detection windows (first, second, and third sub-detection windows) along the phase axis. Each sub-detection window corresponds to a specific phase range, allowing the system to achieve fine-grained phase detection with smaller effective detection window size in each segment, thereby reducing maximum static phase offset while maintaining overall locking reliability through comprehensive coverage.

Inventive Principle:
Principle #1Segmentation

2Measurement precision

If the detection window size is decreased to reduce static phase offset, then the measurement precision is improved, but the reliability of locking under PVT variations deteriorates

Engineering Contradiction:
Improvephase offsetVSAvoidlocking reliability
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The system dynamically adjusts the detection strategy by implementing multiple detection windows that can adapt to different phase conditions. The phase detection part selectively uses appropriate sub-detection windows based on the current phase relationship between reference and feedback signals, enabling the system to maintain high precision while accommodating PVT variations through dynamic detection window selection rather than relying on a single large static window.

Inventive Principle:
Principle #15Dynamics

3Measurement precision

If multiple delay signals with different phases are generated, then the phase detection precision is improved, but the device complexity increases

Engineering Contradiction:
Improvephase detection precisionVSAvoidsignal generation complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The delay locked loop is segmented into distinct functional modules: delay signal generation part, phase synthesizing part, and phase detection part. Each module handles specific tasks, and the phase synthesizing part generates multiple delay signals with different phases by combining outputs from fine delay lines. This modular segmentation manages complexity by organizing the signal generation process into manageable, independent sections rather than a monolithic complex structure.

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS8547153B2Delay locked loop
Publication Date: 2013.10.01 IND ACADEMIC COOP FOUND YONSEI UNIV
  • US8547153B2 patent drawing
  • US8547153B2 patent drawing
  • US8547153B2 patent drawing

AI summary

A delay locked loop in accordance with some embodiments of the inventive concept may include a delay signal generation part generating a first delay signal having a first phase and a second delay signal having a second phase by delaying a reference signal on the basis of a delay control signal; a phase synthesizing part generating at least one third signal having a third phase using the first delay signal and the second delay signal; and a phase detection part generating a control code by comparing the reference signal with each of the first delay signal, the second delay signal and the third signal.