Display Cell Test System With Signal Selection Unit
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Solution Overview
Problem
The existing technologies for testing display cells with integrated sensors for touch recognition or fingerprint recognition lack effective methods to detect electrical defects before the module process, leading to reduced manufacturing yields and increased costs.
Innovation Solution
A test system comprising a display cell with a pixel, data line, optical sensor, and signal selection unit that applies test control signals to selectively connect test signal lines to data and readout lines, allowing for separate testing modes to identify electrical defects in signal lines, thereby improving module process yield and reducing manufacturing costs.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a display cell with integrated sensors is tested before the module process, then manufacturing yield can be improved and costs reduced, but existing testing methods lack the capability to effectively detect electrical defects in signal lines
Solution Approach 1:
The patent segments the testing process into distinct modes (data test mode and sensing test mode) that can be selectively activated. The signal selection unit divides the single test signal line into separate test paths for data lines and readout lines, enabling targeted detection of electrical defects in each signal line type independently. This segmentation allows the testing system to effectively detect electrical defects that would be impossible to identify with conventional unified testing methods.
2Difficulty of detecting and measuring
If separate testing modes are implemented for data lines and readout lines, then electrical defects can be accurately detected, but the device complexity increases due to additional switching transistors and control signals
Solution Approach 1:
The patent merges the testing functionality for both data lines and readout lines into a single integrated signal selection unit. This unit uses switching transistors to dynamically connect a shared test signal line to either the data line or readout line based on the selected test mode. By combining multiple testing functions into one unified structure rather than implementing separate testing systems, the patent reduces overall device complexity while maintaining the capability to accurately detect electrical defects in both signal line types.
3Device complexity
If a single test signal line is used for both data and sensing tests, then device complexity is reduced, but the ability to perform separate testing modes is limited
Solution Approach 1:
The patent implements dynamic reconfigurability in the signal selection unit, which can switch the connection of the test signal line between data lines and readout lines based on the selected test mode. The switching transistors enable the system to dynamically change its configuration from testing data lines to testing readout lines or vice versa. This dynamic capability allows a single test signal line to adaptively serve multiple testing purposes, maintaining low device complexity while achieving full testing versatility for both data and sensing functions.
Data Source
AI summary
A test system, a method of testing a display cell using the same, and a display device are provided. There is provided a test system comprising: a display cell including a pixel and a data line connected to the pixel, an optical sensor and a readout line connected to the optical sensor, and a signal selection unit for selectively connecting a test signal line to any one of the data line and the readout line; and a test member configured to apply a first test control signal to the signal selection unit in a data test mode and apply a second test control signal to the signal selection unit in a sensing test mode.