Display Panel Defect Normalization for Faster Yield Inspection

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Solution Overview

Problem

Existing display device manufacturing processes face a trade-off between reducing manufacturing time and increasing yield, as detecting only line defects reduces time but increases point defect occurrence, while detecting all point defects increases time.

Innovation Solution

A display device with a panel defect normalizer that includes a preliminary defective pixel detector, defective pixel detector, defective line detector, defective line compensator, and defective pixel compensator to identify and compensate for defects, optimizing yield and time efficiency.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Loss of time

If only line defects are detected in the manufacturing process, then manufacturing time is reduced, but point defects may occur in the display device reducing yield

Engineering Contradiction:

Improvemanufacturing timeVSAvoidyield

Core Design Contradiction:

Loss of timeVSReliability

Solution Approach 1:

The defect detection process is segmented into two distinct stages: line defect detection and point defect detection. This segmentation allows the system to efficiently handle different types of defects with appropriate detection methods for each, resolving the contradiction by enabling comprehensive defect detection without uniformly applying time-consuming procedures to all defect types

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

Line defects are detected first as a preliminary step before point defect detection. This preliminary action identifies and addresses obvious line defects early in the process, allowing subsequent point defect detection to focus only on remaining areas, thereby reducing overall detection time while maintaining high yield

Inventive Principle:

Principle #10Preliminary action

2Reliability

If point defects for all pixels are detected in the manufacturing process, then yield of the display device is increased, but manufacturing time is also increased

Engineering Contradiction:

ImproveyieldVSAvoidmanufacturing time

Core Design Contradiction:

ReliabilityVSLoss of time

Solution Approach 1:

The detection process is divided into sequential stages where point defect detection is performed only after line defect detection. This segmentation enables the system to achieve comprehensive defect detection for high yield while minimizing time loss by avoiding redundant detection of already-identified line defects

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

Instead of applying full point defect detection to all pixels uniformly, the system performs partial detection focused on areas not already identified as line defects. This partial action achieves sufficient defect detection for high yield without the excessive time cost of complete pixel-by-pixel inspection

Inventive Principle:

Principle #16Partial or excessive action

Data Source

PatentUS20260065821A1Display device, inspection method of the same, and electronic device including the same

Publication Date: 2026.03.05 SAMSUNG DISPLAY CO LTD

AI summary

A display device includes: a display panel including a plurality of pixels; a sensing circuit to generate sensing values of the plurality of pixels by sensing characteristics of the plurality of pixels; and a panel defect normalizer to compensate for the sensing values, the panel defect normalizer including: a preliminary defective pixel detector to detect a preliminary defective pixel; a defective pixel detector to detect a defective pixel; a defective line detector to detect a defective line; a defective line compensator to compensate for a sensing value of the defective line; and a defective pixel compensator to compensate for a sensing value of the defective pixel.