Display Panel Inspection Using Driving Options for Defect Yield Balance

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Solution Overview

Problem

Display devices using inorganic light-emitting diodes (LEDs) face low yield and reliability issues due to defects in both primary and redundancy light-emitting elements during the manufacturing process, leading to discarded panels.

Innovation Solution

An inspection apparatus and method that calculates defects for both primary and redundancy light-emitting elements in sub-pixels under various driving options, determining panel usability based on the minimum defects to optimize yield and reliability.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If strict defect detection is applied to ensure high reliability, then reliability is improved, but process yield deteriorates due to more panels being discarded

Engineering Contradiction:
Improvedisplay panel reliabilityVSAvoidprocess yield
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent changes the inspection parameter from binary defect detection to multi-level defect grading. By classifying defects into different levels and introducing driving options that allow panels with certain defect levels to be used under specific conditions, the system achieves both high reliability and improved yield. The control unit dynamically adjusts acceptance criteria based on defect characteristics and driving scenarios.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent introduces dynamic inspection criteria that adapt to different driving options and defect scenarios. Rather than using fixed pass/fail thresholds, the system dynamically determines panel usability based on the minimum number of defects across multiple driving options, allowing flexible acceptance decisions that balance reliability and yield.

Inventive Principle:
Principle #15Dynamics

2Measurement precision

If all light-emitting elements are inspected under all driving options, then inspection accuracy is improved, but inspection time and complexity increase

Engineering Contradiction:
Improvedefect detection accuracyVSAvoidinspection time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent applies partial inspection by evaluating only the minimum number of defects across driving options rather than requiring full inspection of all elements under all conditions. This selective approach maintains sufficient accuracy for usability determination while significantly reducing inspection time and computational complexity.

Inventive Principle:
Principle #16Partial or excessive action

Data Source

PatentUS20260029302A1Inspection apparatus and inspection method of light emitting element
Publication Date: 2026.01.29 LG DISPLAY CO LTD
  • US20260029302A1 patent drawing
  • US20260029302A1 patent drawing
  • US20260029302A1 patent drawing

AI summary

An inspection apparatus may include a collection part configured to acquire, according to a plurality of predetermined driving options, an image of first light emitting elements and second light emitting elements arranged in sub-pixels in a display panel, and a control part configured to calculate a number of defects for each driving option based on the acquired image, to compare the calculated number of defects for each driving option with a predetermined threshold value, and to determine whether the display panel is a usable normal panel based on a comparison result.