Display Panel Alignment Patterns Integrated with Metal Routes
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Solution Overview
Problem
The development of narrow borders in display panels is hindered by the need for additional alignment patterns in non-display areas, which obstruct the reduction of border size.
Innovation Solution
Alignment patterns are integrated into the peripheral metal routes in the non-display area, allowing for the observation of substrate shifts along the X and Y directions without requiring additional space for alignment patterns or rulers, utilizing a metal layer with specific pattern configurations and a light shielding layer with corresponding patterns.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If additional alignment patterns are disposed in non-display area, then alignment verification between substrates is enabled, but border width increases
Solution Approach 1:
The patent combines alignment patterns with peripheral metal routes by integrating the alignment pattern structures into the metal route structures. The metal routes serve dual functions: electrical connection and alignment verification. This merging eliminates the need for separate alignment pattern areas, thereby reducing border width while maintaining alignment verification capability.
Solution Approach 2:
The peripheral metal routes are designed to perform multiple functions: electrical connection between substrates and alignment verification. By making the metal routes universal for both electrical and alignment purposes, the patent eliminates the need for dedicated alignment areas, thus reducing border width while preserving measurement precision for alignment verification.
2Area of stationary object
If alignment patterns are integrated into metal routes, then border width is reduced, but alignment verification capability must be maintained
Solution Approach 1:
The alignment patterns are segmented into multiple portions (first portion, second portion, third portion, fourth portion) with different length differences. This segmentation allows for comprehensive alignment verification in both X and Y directions by observing which specific portions align between substrates, maintaining measurement precision while integrating into reduced border space.
Solution Approach 2:
The alignment patterns utilize asymmetric length differences between corresponding portions (first length difference between first and third portions, second length difference between second and fourth portions). This asymmetry enables precise alignment verification by creating distinct alignment references that can be clearly observed when substrates are properly aligned, maintaining measurement capability within the reduced border area.
Data Source
AI summary
In a display panel, multiple first alignment patterns are disposed in a non-display area on a first substrate, and each first alignment pattern includes a first portion and a second portion connected to each other. Multiple second alignment patterns are disposed in the non-display area on a second substrate, and each of the second alignment patterns includes a third portion and a fourth portion. There is a first length difference between the length of each first portion along a first direction and the length of the corresponding third portion along the first direction, and the first length differences are different from each other. There is a second length difference between the length of each second portion along a second direction and the length of the corresponding fourth portion along the second direction, and the second length differences are different from each other.