Display Panel Crack Detection Using Regional Resistance Mapping
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Solution Overview
Problem
Existing panel crack detection methods in display devices can only determine the presence of cracks based on loop disconnection, lacking accuracy in pinpointing the exact location of the crack.
Innovation Solution
A display device with a loop resistance circuit and crack detection circuit that divides the edge region into first and second detection regions with different resistance values, allowing precise determination of crack positions using a multiplexer, integrator, comparator, and counter to measure resistance values.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If a simple loop voltage difference method is used to detect panel cracks, then the detection process is simple and fast, but the accuracy of determining crack position is poor
Solution Approach 1:
The edge region is divided into multiple detection regions (first detection region and second detection region) with different resistance values. Each region corresponds to a specific physical location on the panel edge, allowing the system to determine crack position by identifying which region shows resistance change, thereby achieving both speed and position accuracy.
Solution Approach 2:
Different detection regions are assigned different resistance values to create a resistance distribution pattern across the edge region. This local variation in resistance characteristics allows the crack detection circuit to identify the specific location of a crack by comparing the measured resistance against the known resistance values of different regions.
2Measurement precision
If the edge region is divided into multiple detection regions with different resistance values, then crack position accuracy is improved, but the device complexity increases
Solution Approach 1:
The crack detection circuit is designed to perform multiple functions: it can detect cracks in different regions, determine crack positions, and measure resistance values across multiple detection regions. By using a single multi-functional circuit instead of separate circuits for each function, the patent reduces overall device complexity while maintaining high measurement precision.
Solution Approach 2:
The patent uses resistance value as a key parameter to distinguish between different detection regions and identify crack positions. By changing and measuring the resistance parameter across different regions, the system achieves accurate crack localization without requiring complex imaging or multiple sensor types, thus avoiding excessive device complexity.
3Measurement precision
If a loop resistance circuit with multiple detection regions is implemented, then crack detection accuracy is improved, but the manufacturing complexity increases
Solution Approach 1:
The patent combines multiple detection regions and their corresponding resistance elements into a single integrated loop resistance circuit. This merging approach allows all detection regions to be fabricated as one continuous circuit structure on the panel edge, simplifying the manufacturing process compared to assembling separate circuits for each region, while still maintaining the ability to distinguish crack positions through resistance measurements.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate detection of crack positions and depths, enhancing product yield by identifying cracks during panel and module processes.
Implementation Method 1
a crack detection circuit configured to detect a resistance value of the loop resistance circuit
Data Source
AI summary
A display device includes a display panel, a loop resistance circuit disposed in an edge region of the display panel, and a crack detection circuit configured to detect a resistance value of the loop resistance circuit, wherein the loop resistance circuit includes first detection regions having different resistance values and second detection regions having different resistance values.