Double SLC Programming for Single-Pulse NAND Sub-Block Control

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Solution Overview

Problem

Existing memory devices face increased latency in programming operations due to the need for multiple separate programming pulses and voltage ramping, particularly in high-priority and time-sensitive single level cell (SLC) programming, which affects performance in non-volatile memory devices like NAND flash.

Innovation Solution

Implementing a double single level cell (SLC) program operation where control logic applies a pass voltage to boost the channel potential of multiple sub-blocks and selectively discharges them based on a data pattern, followed by a single programming pulse to concurrently program multiple sub-blocks.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If multiple separate programming pulses are used to program multiple sub-blocks, then each sub-block can be programmed individually, but the latency and operation time increase

Engineering Contradiction:
Improveprogramming accuracyVSAvoidprogramming latency
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent merges multiple separate programming pulses into a single programming pulse that simultaneously programs multiple sub-blocks. The control logic applies one pulse to the wordline while selectively coupling each sub-block to the bitline based on the data pattern, achieving concurrent programming without requiring sequential pulses for each sub-block.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The patent introduces dynamic selective coupling between sub-blocks and bitlines during the programming operation. The control logic dynamically activates or deactivates the coupling of each sub-block to the bitline based on the data pattern, allowing flexible concurrent programming of multiple sub-blocks with a single pulse while maintaining programming accuracy.

Inventive Principle:
Principle #15Dynamics

2Manufacturing precision

If multiple separate programming operations are performed for each sub-block, then complete programming coverage is achieved, but the overall operation time increases

Engineering Contradiction:
Improveprogramming completenessVSAvoidprogramming throughput
Core Design Contradiction:
Manufacturing precisionVSProductivity

Solution Approach 1:

The patent combines multiple sub-block programming operations into a single unified programming operation. By selectively coupling different sub-blocks to the bitline based on the data pattern, the system achieves complete programming coverage across multiple sub-blocks while maintaining high throughput through concurrent execution.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The patent segments the data pattern into multiple sub-patterns, each corresponding to a different sub-block. The control logic selectively activates coupling to specific sub-blocks based on which sub-patterns require programming, enabling parallel processing of different data segments without compromising completeness.

Inventive Principle:
Principle #1Segmentation

3Reliability

If voltage ramping is performed for each programming pulse, then proper voltage levels are achieved, but the operation complexity and time increase

Engineering Contradiction:
Improvevoltage control accuracyVSAvoidcontrol operation complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent merges multiple voltage ramping operations into a single voltage ramping sequence. The control logic applies one ramping operation to generate the programming voltage on the wordline, which is then dynamically distributed to multiple sub-blocks through selective coupling, eliminating the need for separate ramping operations for each sub-block.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The patent performs preliminary voltage ramping on the wordline before the actual programming pulse is applied. This preliminary action prepares the voltage infrastructure for concurrent programming of multiple sub-blocks, reducing the need for repeated voltage setup operations and simplifying the overall control sequence.

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS12387790B2Double single level cell program in a memory device
Publication Date: 2025.08.12 MICRON TECHNOLOGY INC
  • US12387790B2 patent drawing
  • US12387790B2 patent drawing
  • US12387790B2 patent drawing

AI summary

Control logic in a memory device causes a pass voltage to be applied to a plurality of wordlines of a block of a memory array of the memory device, the block comprising a plurality of sub-blocks, and the pass voltage to boost a channel potential of each of the plurality of sub-blocks to a boost voltage. The control logic further selectively discharges the boost voltage from one or more of the plurality of sub-blocks according to a data pattern representing a sequence of bits to be programmed to respective memory cells of the plurality of sub-blocks. In addition, the control logic causes a single programming pulse to be applied to a selected wordline of the plurality of wordlines of the block to program the respective memory cells of the plurality of sub-blocks according to the data pattern.