Dry Etching Printing Substrate for LCD Pattern Resolution

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Solution Overview

Problem

The existing resist printing methods for liquid crystal displays face challenges in achieving precise minute patterns due to the isotropic etching properties of wet etching, which result in significant loss of critical dimension and poor pattern resolution, making it difficult to manufacture substrates with fine features.

Innovation Solution

A printing substrate for liquid crystal displays is developed using a transparent insulating substrate with a material layer suitable for dry etching, such as Si-based materials like a-Si, SiNx, or SiOx, where a photo resist is used as an etching mask to minimize critical dimension loss and improve pattern resolution, and a support layer is added to mitigate film stress and bending.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If wet etching is used to form printing patterns, then the etching process is simple and cost-effective, but the critical dimension is significantly lost due to isotropic etching properties

Engineering Contradiction:
Improveetching process simplicityVSAvoidcritical dimension accuracy
Core Design Contradiction:
Ease of manufactureVSManufacturing precision

Solution Approach 1:

The patent changes the etching method from wet etching to dry etching, fundamentally altering the etching parameters and mechanism. This transition enables anisotropic etching with precise directional control, achieving critical dimensions less than 10 μm while maintaining manufacturing feasibility through established dry etching processes

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent replaces the chemical solution-based wet etching system with a plasma-based dry etching system. This substitution introduces ion acceleration and chemical action in a controlled plasma environment, enabling precise pattern formation without the isotropic limitations of wet etching

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Reliability

If the etching depth is increased to improve printing property, then the printing performance improves, but the pattern width broadens due to isotropic etching

Engineering Contradiction:
Improveprinting propertyVSAvoidpattern width control
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

The patent changes the etching methodology from isotropic wet etching to anisotropic dry etching, fundamentally altering how depth and width relate during etching. This enables independent control of etching depth and pattern width, allowing deep etching without lateral broadening

Inventive Principle:
Principle #35Parameter changes

3Manufacturing precision

If a material layer is added to enable dry etching, then pattern resolution improves, but film stress causes substrate bending

Engineering Contradiction:
Improvepattern resolutionVSAvoidsubstrate flatness
Core Design Contradiction:
Manufacturing precisionVSStability of the object's composition

Solution Approach 1:

The patent applies a support layer on the opposite side of the printing pattern to counterbalance the film stress induced by the material layer. This support layer acts as a counterweight, compensating for the stress-induced bending and maintaining substrate flatness while preserving the benefits of dry etching

Inventive Principle:
Principle #8Anti-weight (Counterweight)

Solution Approach 2:

The patent creates a composite structure consisting of the transparent insulating substrate, the material layer for dry etching, and the support layer. This composite design combines materials with different mechanical properties to achieve both precise pattern formation and substrate stability

Inventive Principle:
Principle #40Composite materials

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables the efficient formation of minute patterns with improved pattern resolution and transcription properties, allowing for the creation of substrates with critical dimensions less than 10 μm in width and greater than 20 μm in depth, while preventing substrate bending and enhancing the overall manufacturing process.

Implementation Method 1

a photo resist is used as an etching mask to minimize critical dimension loss and improve pattern resolution

Methodology Applied
Scientific EffectPhotolithography masking: Photography

Implementation Method 2

a dry etching performs an etching through the acceleration force and chemical action of ions in a plasma state using a mixed chemical gas, Ar or the like

Methodology Applied
Scientific EffectDry etching: Plasma

Data Source

PatentUS8486608B2Printing substrate for liquid crystal display, and manufacturing method thereof
Publication Date: 2013.07.16 LG DISPLAY CO LTD
  • US8486608B2 patent drawing
  • US8486608B2 patent drawing
  • US8486608B2 patent drawing

AI summary

The present invention relates to the implementation of minute patterns and thus improving pattern resolution and transcription property. Provided is a printing substrate for a liquid crystal display comprising a transparent insulating substrate, and a material layer for dry etching formed on an upper surface of the transparent insulating substrate, the material layer for dry etching constituting a printing pattern, and a manufacturing method of a printing substrate for a liquid crystal display comprising forming a material layer on a transparent insulating substrate, applying a photo resist along a printing pattern on the upper side of the material layer, dry-etching the material layer along the printing pattern using the photo resist as an etching mask, and striping the photo resist.