Dry Non-Plasma Surface Treatment for Precise Material Removal

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Solution Overview

Problem

Current material processing methodologies face challenges in efficiently removing material from substrates using pattern etching techniques, particularly in reducing feature size and altering surface chemistry without plasma, which limits precision and effectiveness.

Innovation Solution

A dry non-plasma treatment system and method that combines chemical and thermal treatments, utilizing a temperature-controlled process chamber with a chemical treatment system to alter surface layers and a thermal treatment system to evaporate these layers, controlled by a system that manages process gas introduction and substrate temperature.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If chemical treatment is applied to alter surface chemistry of hard mask layers, then feature size reduction is enabled, but material removal efficiency is insufficient without effective desorption

Engineering Contradiction:
Improvefeature size reductionVSAvoidmaterial removal efficiency
Core Design Contradiction:
Manufacturing precisionVSProductivity

Solution Approach 1:

The patent changes the thermal parameter by introducing a thermal treatment step that heats the substrate to a temperature sufficient to desorb the chemically altered surface layers. This parameter change enables efficient material removal while maintaining the chemical treatment's precision for feature size reduction.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent combines chemical treatment and thermal treatment in a continuous process sequence. The chemical treatment alters the surface chemistry, and the subsequent thermal treatment immediately desorbs the altered layers, creating a continuous and efficient material removal process without interruption.

Inventive Principle:
Principle #20Continuity of useful action

2Productivity

If plasma-based etching is used for material removal, then etching speed is improved, but damage to underlying layers and contamination occur

Engineering Contradiction:
Improveetching speedVSAvoiddamage to underlying layers and contamination
Core Design Contradiction:
ProductivityVSObject-affected harmful factors

Solution Approach 1:

The patent replaces the plasma-based mechanical/chemical etching system with a non-plasma system that uses chemical vapor deposition followed by thermal desorption. This substitution eliminates the harmful plasma effects while maintaining material removal capability through controlled chemical and thermal processes.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Productivity

If thermal treatment is applied to desorb altered surface layers, then material removal is achieved, but temperature control precision is required to avoid damaging underlying layers

Engineering Contradiction:
Improvematerial removal capabilityVSAvoidtemperature control precision
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The patent specifies a temperature range for the thermal treatment step that is sufficient to desorb the chemically altered surface layers but remains below the damage threshold for underlying layers. This parameter optimization enables material removal while protecting sensitive structures.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables precise removal of material from substrates by chemically altering and then thermally desorbing surface layers, improving feature size reduction and surface processing without the limitations of plasma-based methods.

Implementation Method 1

a chemical treatment system coupled to the temperature controlled process chamber and configured to introduce a process gas to the temperature controlled process chamber, wherein the process gas chemically alters exposed surface layers on the substrate

Methodology Applied
Scientific EffectChemical alteration: Chemical Bonding

Implementation Method 2

a thermal treatment system, separate from the temperature-controlled substrate holder, coupled to the temperature controlled process chamber and configured to elevate the temperature of the substrate in the temperature controlled process chamber, wherein the elevated temperature causes evaporation of the chemically altered surface layers

Methodology Applied
Scientific EffectEvaporation: Evaporation

Data Source

PatentUS11745202B2Dry non-plasma treatment system
Publication Date: 2023.09.05 TOKYO ELECTRON LTD
  • US11745202B2 patent drawing
  • US11745202B2 patent drawing
  • US11745202B2 patent drawing

AI summary

A dry non-plasma treatment system for removing material is described. The treatment system is configured to provide chemical treatment of one or more substrates, wherein each substrate is exposed to a gaseous chemistry under controlled conditions including surface temperature and gas pressure. Furthermore, the treatment system is configured to provide thermal treatment of each substrate, wherein each substrate is thermally treated to remove the chemically treated surfaces on each substrate.