Dual Decoding Paths for Faster Unselected Word Line Ramp-Up

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Solution Overview

Problem

Non-volatile memory devices face challenges in achieving faster ramp-up times for memory operations, particularly in biasing all word lines to an unselected level, which hinders overall performance and efficiency.

Innovation Solution

The proposed solution involves using both decoding paths concurrently to bias all word lines of a block at the unselected level, optimizing memory structure and peripheral circuitry by separating them onto separate dies for individual technology optimization, and implementing advanced bonding techniques like Cu-to-Cu bonding and hybrid bonding to enhance connectivity and reduce fabrication steps.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If a single decoding path is used to bias all word lines to an unselected level, then device complexity is reduced, but ramp-up time increases and productivity decreases

Engineering Contradiction:
Improvedecoding path complexityVSAvoidramp-up time
Core Design Contradiction:
Device complexityVSLoss of time

Solution Approach 1:

The patent divides the decoding function into two separate decoding paths: a first decoding path for selecting specific word lines and a second decoding path for biasing all word lines to an unselected level. This segmentation allows each path to be optimized for its specific function, with the second path dedicated exclusively to rapid unselected level biasing, thereby reducing ramp-up time without overall system complexity increase.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent introduces a temporal dimension to the decoding process by operating the two decoding paths concurrently during memory operations. The first decoding path operates during the read/program phase while the second decoding path simultaneously biases unselected word lines, effectively adding a parallel time dimension that reduces overall ramp-up time without increasing spatial complexity.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Device complexity

If memory structure and peripheral circuitry are integrated on the same die, then device complexity is reduced, but performance optimization is limited

Engineering Contradiction:
Improveintegration structureVSAvoidmemory operation efficiency
Core Design Contradiction:
Device complexityVSProductivity

Solution Approach 1:

The patent physically separates the memory structure from the peripheral circuitry onto different dies. The memory array is fabricated on a first die using memory-optimized processes while the peripheral circuitry (including the dual decoding paths) is fabricated on a second die using logic-optimized processes. This segmentation enables independent technology optimization for each component, improving overall memory operation efficiency.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent introduces bond pads as intermediary connection points between the memory die and peripheral die. These bond pads enable high-speed electrical connections while allowing each die to be optimized independently. The intermediary bonding interface facilitates efficient data and control signal transmission between the separated components without compromising performance.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Ease of manufacture

If conventional bonding techniques are used for die attachment, then manufacturing is simpler, but connectivity performance and fabrication efficiency are reduced

Engineering Contradiction:
Improvebonding process simplicityVSAvoidfabrication efficiency
Core Design Contradiction:
Ease of manufactureVSProductivity

Solution Approach 1:

The patent transitions from conventional wire bonding to direct Cu-to-Cu bonding and hybrid bonding techniques. This parameter change in the bonding method enables lower resistance connections, higher bandwidth, and reduced parasitic effects. The advanced bonding techniques allow for smaller bond pad sizes and higher density connections, improving fabrication efficiency and connectivity performance while remaining manufacturable with modern semiconductor processes.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS20250308596A1Techniques for faster ramp-up times for unselected word lines in non-volatile memory
Publication Date: 2025.10.02 SANDISK TECHNOLOGIES LLC
  • US20250308596A1 patent drawing
  • US20250308596A1 patent drawing
  • US20250308596A1 patent drawing

AI summary

In a non-volatile memory array such as a NAND memory, when a word line of a block is selected for a read or write, the selected word line is biased at one level through one decoding path, while the unselected word lines of a block are biased at a different level though another decoding path. For memory operations, such as leakage detection, in which all of the word lines are biased with the same level, such as an unselected voltage level, the selected word line decoding path is otherwise unused. To increase the speed with which word lines can be ramped-up, for operation that bias all of the word lines of a block at the unselected level, both of the decoding paths can be used concurrently to reduce ramp-up times.