Dual Read Word Line Design for Memory Power Reduction

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Solution Overview

Problem

Existing memory designs consume unnecessary power due to the need to recharge read bit lines for all bit cells in a row during read operations, even when not all cells need to be read, as a single read word line discharges all bit cells, leading to inefficient power usage.

Innovation Solution

Implementing a dual read word line design where separate read word lines are used for different subsets of bit cells within the same row, allowing only the necessary bit cells to be enabled during read operations, thereby reducing unnecessary discharging and recharging.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If a single read word line is used to access all bit cells in a row, then the read operation can access any bit cell in the row, but power is consumed to recharge read bit lines for all bit cells even when not all cells need to be read

Engineering Contradiction:
Improveread access capabilityVSAvoidpower consumption
Core Design Contradiction:
Adaptability or versatilityVSUse of energy by moving object

Solution Approach 1:

The patent divides a single read word line into multiple segmented read word lines (first read word line and second read word line), where each segment is connected to a specific subset of bit cells in the row. This segmentation allows selective activation of only the necessary word line segment for the current read operation, preventing unnecessary discharge and recharge of read bit lines for other bit cells, thereby reducing power consumption while maintaining full row access capability.

Inventive Principle:
Principle #1Segmentation

2Device complexity

If a single read word line is used for all bit cells, then the design is simpler, but unnecessary discharging and recharging of read bit lines occurs

Engineering Contradiction:
Improveread word line designVSAvoidpower waste
Core Design Contradiction:
Device complexityVSLoss of energy

Solution Approach 1:

The read word line is segmented into multiple independent segments (first and second read word lines), each controlling a specific subset of bit cells. This segmentation enables selective activation, where only the required segment is activated during each read operation, avoiding unnecessary discharge-recharge cycles of read bit lines and reducing energy loss while maintaining manageable design complexity.

Inventive Principle:
Principle #1Segmentation

3Use of energy by moving object

If multiple read word lines are implemented for different subsets of bit cells, then power consumption is reduced, but the device complexity increases

Engineering Contradiction:
Improvepower consumptionVSAvoidread word line structure
Core Design Contradiction:
Use of energy by moving objectVSDevice complexity

Solution Approach 1:

The patent segments the read word line into a manageable number of segments (first and second read word lines) that collectively cover all bit cells in the row. This segmentation reduces power consumption through selective activation while maintaining reasonable device complexity by using a limited number of segments rather than excessive division.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The segmented read word lines are designed to collectively provide universal access to all bit cells in the row. Each segment serves multiple bit cells within its subset, and together the segments cover the entire row, maintaining the multi-functional capability of accessing any bit cell while enabling power-saving selective activation.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentEP3036744B1Memory with multiple word line design
Publication Date: 2020.08.05 QUALCOMM INC
  • EP3036744B1 patent drawingFigure 1
  • EP3036744B1 patent drawingFigure 2
  • EP3036744B1 patent drawingFigure 3

AI summary

Disclosed are various apparatuses and methods for a memory with a multiple read word line design. A memory may include a plurality of bit cells arranged in a row, a first read word line connected to a first subset of the plurality of bit cells, and a second read word line connected to a second subset of the plurality of bit cells, wherein the first and second subsets are located in the same row of bit cells. A method may include asserting, during a first read operation, a first read word line connected to a first subset of a plurality of bit cells arranged in a row of bit cells, and asserting, during a second read operation, a second read word line connected to a second subset of the plurality of bit cells, wherein the first and second subsets are located in the same row of bit cells.