Dual-Resolution Optical Device for Transparent Substrate Flaw Detection
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Solution Overview
Problem
Existing methods for detecting internal flaws in transparent substrates, such as glass, are inefficient and lack accuracy due to reliance on manual inspection and multiple illumination modes, which hinder real-time quality control on production lines.
Innovation Solution
An optical device with dual detection units, one for low-resolution and one for high-resolution imaging, where the first unit detects flaws at an inclined object plane, allowing for efficient identification of internal flaws without the need for detailed inspection of all detected flaws, and a processor determines which flaws require high-resolution analysis, optimizing detection efficiency and cost.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If manual inspection with enlarged images is used to detect internal flaws, then detection accuracy is improved, but detection efficiency deteriorates
Solution Approach 1:
The detection process is segmented into two stages: first, a low-resolution detection unit performs a preliminary scan to identify potential flaw locations; second, a high-resolution detection unit focuses only on those specific locations for accurate classification. This segmentation allows the system to maintain high detection accuracy while significantly improving detection efficiency by avoiding detailed analysis of the entire substrate.
2Measurement precision
If high-resolution detection is applied to the entire substrate, then detection accuracy is improved, but device cost deteriorates
Solution Approach 1:
The system employs different detection qualities in different spatial regions: a low-resolution detection unit covers the entire substrate area for initial screening, while a high-resolution detection unit is applied only to specific local regions where flaws are suspected. This local quality approach reduces the total number of high-resolution pixels required, thereby lowering device cost while maintaining detection accuracy for actual flaws.
3Measurement precision
If multiple illumination modes are used to distinguish surface flaws from internal flaws, then detection accuracy is improved, but detection efficiency deteriorates
Solution Approach 1:
The low-resolution detection unit performs a preliminary action by scanning the entire substrate and identifying potential flaw locations before the high-resolution detection unit conducts detailed analysis. This preliminary action filters out non-flaw regions, allowing the system to use multiple illumination modes only when necessary, thereby improving detection efficiency while maintaining accuracy.
4Device complexity
If low-resolution detection is used to cover the entire substrate width, then device cost is reduced, but detection precision deteriorates
Solution Approach 1:
The detection system is segmented into two functional units with different resolution characteristics. The low-resolution detection unit covers the entire substrate width for cost-effective initial screening, while the high-resolution detection unit provides precise analysis for suspected flaw regions. This segmentation allows the system to achieve both cost reduction and adequate detection precision.
Solution Approach 2:
The low-resolution detection unit acts as an intermediary between the substrate and the high-resolution detection unit. It processes the entire substrate area first, filtering and identifying potential flaw locations, which then become the target for high-resolution analysis. This intermediary role allows the system to use fewer high-resolution pixels while maintaining overall detection precision.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The optical device achieves high detection efficiency and low cost by selectively identifying internal flaws at high resolution, reducing the number of pixels required and enabling faster substrate movement without missing flaws, thus enhancing real-time quality control.
Implementation Method 1
The first detection unit includes a first photosensitive element and a first lens between the substrate and the first photosensitive element
Implementation Method 2
The first photosensitive element and the first lens are disposed such that an object plane is inclined relative to the substrate
Implementation Method 3
The second detection unit includes a second photosensitive element and a second lens between the substrate and the second photosensitive element
Implementation Method 4
the second detection unit includes a second photosensitive element and a second lens
Data Source
AI summary
An optical device and a method for detecting a flaw of a transparent substrate. A first detection unit is configured to detect the substrate at a predetermined low resolution, where the first detection unit includes a first photosensitive element and a first lens between the substrate and the first photosensitive element, and the first photosensitive element and the first lens are disposed such that an object plane is inclined relative to the substrate; a second detection unit configured to detect the substrate at a predetermined high resolution, where the second detection unit includes a second photosensitive element and a second lens between the substrate and the second photosensitive element; and a processor configured to determine a portion of the flaws detected by the first detection unit as flaws to be detected by the second detection unit, and to determine a type of flaw for the substrate imaged.