Dynamic Latch Circuit Reduces Power via Clock Gating
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Solution Overview
Problem
Existing data storage elements in computing devices, such as static latches, consume significant power due to additional feedback transistors, leading to reduced power efficiency, especially in systems with a large number of data storage elements.
Innovation Solution
The implementation of a dynamic latch circuit using NMOS and PMOS transistors, which reduces the number of transistors required compared to static latch circuits, allowing for efficient data storage with lower power consumption by leveraging leakage properties to determine the storage duration of logic states.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If static latch circuits are used to store data, then data storage capability is achieved, but power consumption increases due to feedback transistors
Solution Approach 1:
The patent transitions from static latch circuits to dynamic latch circuits, where the circuit state changes over time based on clock signals. The dynamic latch uses clocked transistors that are only active during specific time windows, allowing data to be captured and held temporarily without continuous power consumption from feedback transistors. This dynamic operation mode reduces power consumption while maintaining data storage capability during the hold period.
Solution Approach 2:
The dynamic latch circuit operates using periodic clock signals that control the timing of data capture and hold operations. The clock signals enable the latch to periodically capture data on the rising edge and hold it during the clock cycle, then transfer to the next stage. This periodic operation eliminates the need for continuous feedback transistor activation, reducing power consumption while maintaining reliable data storage throughout the clock period.
2Use of energy by moving object
If dynamic latch circuit is used to reduce transistor count, then power efficiency improves, but data storage duration is limited by leakage properties
Solution Approach 1:
The dynamic latch circuit maintains continuous useful action by chaining multiple latches together in a pipeline configuration. Each latch holds data for one clock period, and the continuous flow of clock signals ensures that data is continuously captured, held, and transferred through the pipeline. This continuous operation compensates for the limited individual latch hold time by maintaining an unbroken data flow through multiple stages.
Solution Approach 2:
The dynamic latch circuit incorporates feedback mechanisms through the clocked transistor configuration, where the output of one latch feeds back to control the timing and transfer of data to the next stage. The clock signals provide feedback timing information that synchronizes the capture and transfer operations across multiple latches, ensuring data integrity is maintained throughout the pipeline despite the temporary nature of individual latch storage.
Data Source
AI summary
A data storage device includes a dynamic latch circuit. The dynamic latch circuit includes a first NMOS transistor, a second NMOS transistor, a first PMOS transistor, and a second PMOS transistor. A source terminal of the first NMOS transistor is connected to a source terminal of the first PMOS transistor to form a data input terminal. A drain terminal of the first NMOS transistor is connected to a drain terminal of the first PMOS transistor to form a latch internal node. A gate terminal of the first NMOS transistor is connected to a clock input signal. A gate terminal of the first PMOS transistor is connected to an inverse clock input signal. A gate terminal of the second NMOS transistor and a gate terminal of the second PMOS transistor are connected to the latch internal node. A drain terminal of the second NMOS transistor and a drain terminal of the second PMOS transistor are connected to form an inverted output terminal.