Dynamic Spectral Acquisition for Mineral Classification Accuracy
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing methods for material and mineral classification struggle to efficiently identify and distinguish similar X-ray spectra with existing methods for material and mineral analysis.
Innovation Solution
Implement a system comprising a scanning microscope system with a first detector and a second detector, a data-processing system, and a data-storage component, configured for providing images and spectra based on emissions from scan locations, and calculating confidence scores to select and adjust dwell periods for improved spectral and image segmentation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If X-ray acquisition is performed at all scan locations to obtain compositional information, then measurement precision is improved, but loss of time increases significantly
Solution Approach 1:
The patent segments the scan locations into different groups based on image intensity characteristics. High-intensity regions (likely mineral grains) are selected for X-ray acquisition while low-intensity regions are excluded. This segmentation approach reduces the number of locations requiring time-consuming X-ray measurements while maintaining compositional analysis accuracy for the relevant mineral phases.
Solution Approach 2:
The patent applies different acquisition strategies to different regions of the sample based on local image characteristics. Regions with intensity above a threshold receive full X-ray spectral acquisition, while regions below the threshold are processed differently or excluded. This local quality approach optimizes time allocation by focusing resources on regions most likely to contain mineral grains of interest.
2Measurement precision
If dwell period is increased to improve spectral quality, then measurement precision is improved, but productivity decreases
Solution Approach 1:
The patent applies partial action by acquiring X-ray spectra only at selected scan locations that meet intensity criteria, rather than at all locations. This reduces the total number of spectral acquisitions needed while maintaining sufficient spectral quality for mineral identification in the regions that matter most for compositional analysis.
Solution Approach 2:
The patent dynamically adjusts the dwell period based on the detected image intensity at each scan location. Regions with higher intensity (indicative of mineral grains) receive longer dwell periods and full spectral acquisition, while lower intensity regions receive shorter or no X-ray acquisition. This parameter change strategy optimizes both spectral quality and overall productivity by adapting measurement parameters to local sample characteristics.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enhances the accuracy and efficiency of material and mineral analysis by dynamically adjusting dwell periods and improving spectral quality, allowing for reliable discrimination of chemically similar materials.
Implementation Method 1
Backscattered electrons (BSE) originate from the primary electron beam, which, as the name suggests, are reflected back (i.e., out of the sample) via elastic scattering on the sample atoms.
Implementation Method 2
characteristic X-rays are emitted when primary electrons cause the ejection of an electron in an inner shell of a sample atom, creating an electron hole. This electron hole is then filled by another electron from an outer atomic shell through the emission of an X-ray photon.
Data Source
AI summary
The invention relates to method and system configured for material analysis and mineralogy. At least one image based on first emission from a sample is provided. First spectra of the sample based on second emissions from the second scan locations of the image are provided. A confidence score is calculated for every first spectrum, and second scan location(s) with confidence score(s) below a threshold value are selected. Second emissions from the selected second scan location(s) are acquired to provide new image and determine new second scan locations within the respective new image.