Material Analysis Using Wave/Particle Radiation TRIZ Cases
- Double-Sealed Sample Holder for Ultra-High Vacuum Hydrogen Permeation
Double sealing and an electrolyte chamber enable hydrogen introduction in ultra-high vacuum while improving permeation signal intensity and measurement speed.
- Microcrystal Ligand Analysis Using On-Grid Soaking and Electron Diffraction
On-grid soaking and FIB-milled microcrystals improve ligand uptake without crystal cracking, enabling clearer binding-site models.
- Multiple Plasma Ion Source for Inline SIMS Without Gas Switching
Premixed oxygen and inert gases enable inline SIMS ion switching without gas changes, cutting downtime and keeping wafers usable after metrology.
- Angle-resolving photoelectron spectrometer and method
A positive lens and negative compensation electrode expand electron acceptance angle while cancelling sample-surface fields that distort trajectories.
- Electron-Transparent Sample Prep With Intact Surface Preservation
Milling only the sample’s second face forms an electron-transparent layer while preserving the original surface for correlative in-situ analysis.
- Electron Microscope Beam Deflection for Off-Axis Signal Detection
Dual centering assemblies steer the main beam around an off-axis detector, preserving beam quality while capturing return electron signals.
- Charged Particle Microscopy With Liquifiable Ice Barriers
A liquifiable vitreous ice barrier separates particles until triggered melting enables time-resolved microscopy without complex micro-reactors.
- Fluorescent Fiducials for Precise FIB/SEM ROI Sample Preparation
Fluorescent fiducials give FIB/SEM sample prep a shared reference to locate the region of interest and avoid misaligned extraction.
- Time-Resolved Charged Particle Microscopy Using a Liquifiable Barrier
A liquifiable barrier such as vitreous ice replaces complex micro-reactors, enabling time-resolved particle interaction imaging with high spatial detail.
- Lithium Cell Spectroscopic Sorting for Direct Recycling
Spectroscopy and physical sensing classify spent lithium cells by chemistry, improving recycling separation and safer transport packaging.
- Detector Interconnection Architecture for Higher Bandwidth and Pixel Rate
An interconnection layer with switching elements cuts parasitic effects, raising analog bandwidth and pixel rate in charged-particle detectors.
- Overlay Target Imaging With Sensor Shift Compensation
Opposite scan patterns and image registration compensate secondary and backscattered electron sensor lag for accurate overlay measurement.
- SEM Working Distance Measurement Using Laser Interferometry
Laser interferometry and mirror routing enable precise SEM working distance measurement on dielectric and conductive samples, even with warpage.
- Semiconductor Sample Preparation for Charge-Stable Beam Imaging
Electrical connections added to isolated semiconductor regions dissipate charge during beam inspection, improving image quality and accuracy.
- Dynamic Spectral Acquisition for Mineral Classification Accuracy
Confidence-guided rescanning adjusts dwell time and scan locations to separate similar X-ray spectra in mineral analysis.