Dynamic Electronic Test Instrumentation Switching for Faster Setup
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Solution Overview
Problem
Existing electronic instrumentation systems require manual reconfiguration and physical manipulation of connections between multiple instruments, which is time-consuming and inefficient, lacking flexibility and automation.
Innovation Solution
A dynamically configurable electronic test equipment system with digital and analogue logic circuitry, utilizing a cross-bar switch for software-controlled reconfiguration of connections between instruments and a device-under-test, allowing for rapid and flexible instrument reconfiguration.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If manual reconfiguration of connections between multiple electronic instruments is used, then flexibility and adaptability are maintained, but time consumption and operational efficiency deteriorate
Solution Approach 1:
The patent replaces manual mechanical connection reconfiguration with automated electronic switching. A processor-controlled switching system automatically establishes and modifies connections between multiple electronic instruments and the device under test, eliminating the need for manual cable plugging and unplugging while maintaining full reconfiguration capability.
Solution Approach 2:
The system performs self-reconfiguration through automated control. The processor monitors test requirements and automatically adjusts the connection topology between instruments without requiring manual intervention, enabling the system to adapt itself to different test scenarios rapidly.
2Productivity
If dedicated switching equipment is designed and built for specific test setups, then operational efficiency and automation improve, but device complexity and resource requirements worsen
Solution Approach 1:
The patent implements a universal switching fabric that can accommodate multiple test configurations and instrument combinations. Rather than designing dedicated switching equipment for each specific test setup, a single multi-functional switching system handles various connection topologies, reducing overall system complexity while maintaining high productivity.
Solution Approach 2:
The switching system is dynamically reconfigurable through software control. The processor can programmatically alter connection patterns in real-time based on test requirements, providing the flexibility of dedicated equipment without the permanence and complexity of hardwired solutions.
3Ease of operation
If manual connection moving is performed between instruments, then ease of operation and flexibility are maintained, but operational effectiveness and resource utilization deteriorate
Solution Approach 1:
The patent introduces an intermediary switching system between the electronic instruments and the device under test. This intermediary layer handles all connection management tasks, allowing the engineer to focus on test methodology while the automated switch manages the physical connectivity, thereby improving both ease of operation and productivity.
4Adaptability or versatility
If physical connections between multiple electronic instruments are manually attached and moved, then adaptability to different test scenarios is maintained, but automation level and operational speed worsen
Solution Approach 1:
The patent substitutes manual mechanical connection operations with automated electronic switching. The processor-controlled switch matrix dynamically establishes virtual connections between instruments based on test requirements, maintaining full adaptability while achieving complete automation and rapid reconfiguration.
Data Source
AI summary
An electronic test equipment system includes: a user interface; and a dynamically configurable multi-instrument operably coupleable to the user interface. A processor is arranged to apply at least one control signal to a software configurable switch that connects at least one selectable item of test equipment of at least one of: dynamically configurable digital logic circuitry, dynamically configurable analogue circuitry, to at least one individual input-output, IO, of an IO interface that re-configures the dynamically configurable multi-instrument to function as a different measurement or test instrument for a device under test.


