ECC-Corrected e-Fuse Sensing for Reliable Memory Settings
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Solution Overview
Problem
As memory scaling technology improves, sensing errors in e-fuse blown results become more frequent due to interference between e-fuses, leading to inconsistent and unreliable settings.
Innovation Solution
A memory system incorporating a sensing circuit, Error-Correcting Code (ECC) circuit, and registers to correct e-fuse blown results by identifying and correcting errors in normal e-fuse subsets while preserving parity e-fuse subsets, thereby generating reliable settings for memory operations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If memory scaling technology is improved to increase memory capacity, then memory capacity is improved, but sensing precision of e-fuse blown results deteriorates due to interference between e-fuses
Solution Approach 1:
The patent divides e-fuses into multiple subsets (first subset, second subset, third subset) and processes them separately through different circuits. This segmentation allows the system to handle sensing results from different e-fuse groups independently, enabling error correction for subsets with sensing errors while preserving results from subsets without errors, thus resolving the measurement precision deterioration caused by scaling.
Solution Approach 2:
The patent introduces an intermediary processing mechanism that includes first determination circuitry, second determination circuitry, and third determination circuitry. These intermediary circuits act as mediators between the sensing circuit and the final configuration output, enabling the system to identify and correct erroneous sensing results before they affect the final memory configuration.
2Ease of operation
If e-fuse sensing is performed to determine memory settings, then memory settings are configured, but reliability of blown results deteriorates due to errors in sensing
Solution Approach 1:
The patent implements a feedback mechanism where sensing results from multiple e-fuse subsets are evaluated, compared, and processed through determination circuits that can identify errors. The system uses the sensing results from reliable subsets to correct errors in unreliable subsets, creating a feedback loop that improves overall reliability while maintaining ease of operation.
Solution Approach 2:
The patent changes the parameter evaluation approach by introducing multiple subsets with different evaluation criteria. The first determination circuitry evaluates blown status based on first parameters, the second determination circuitry uses second parameters, and the third determination circuitry uses third parameters. This multi-parameter approach allows the system to identify and correct sensing errors, improving reliability without complicating the operation.
3Adaptability or versatility
If all e-fuse sensing results are used for memory configuration, then complete settings are achieved, but accuracy deteriorates due to inclusion of erroneous results
Solution Approach 1:
The patent segments e-fuses into multiple subsets and processes them through different determination circuits. This segmentation enables the system to identify which subsets contain erroneous sensing results and which do not. The third determination circuitry uses results from subsets without errors to correct subsets with errors, ensuring that the final memory configuration is both complete and accurate.
Solution Approach 2:
The patent converts the harmful effect of sensing errors into a beneficial correction process. By introducing multiple subsets and determination circuits, the system can identify erroneous results and use reliable results from other subsets to correct them. The errors that would normally degrade accuracy are instead used as indicators to trigger the correction mechanism, ultimately improving the accuracy of the final configuration.
Data Source
AI summary
A memory includes a plurality of e-fuse sets, a sensing circuit, an Error-Correcting Code (ECC) circuit, and a plurality of registers. Each e-fuse set includes a plurality of e-fuses, and each e-fuse of the plurality of e-fuses corresponds to a first blown result. The sensing circuit senses the plurality of e-fuses to output a plurality of first blown results. The ECC circuit receives the plurality of first blown results and corrects a first blown result if the first blown result includes an error or directly outputs the first blown result if the first blown result comprises no error to generate a second blown result. The plurality of registers receive a plurality of second blown results. The plurality of second blown results adjusts predetermined settings of the memory, and a number of the plurality of registers is less than a number of the plurality of e-fuses.