Edge-Clamping Deposition Ring for Flat Thin Substrates
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Solution Overview
Problem
Thin semiconductor substrates tend to bow during processing in deposition chambers, leading to non-uniformity and requiring additional bonding and debonding steps with carrier plates, which increases processing time.
Innovation Solution
A process kit for deposition chambers that includes a deposition ring with a first and second portion, where the portions align to form a clamping surface, allowing mechanical clamping of the substrate's outer rim to flatten it, eliminating the need for bonded carriers and reducing processing time.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If thin substrates are processed in deposition chambers, then substrate processing capability is improved, but substrate bowing occurs leading to process non-uniformity
Solution Approach 1:
The deposition ring is divided into two separate portions that can be positioned independently. The first portion engages the substrate at a first radial position while the second portion engages at a second radial position, allowing distributed support across the substrate surface to prevent bowing and maintain process uniformity
2Manufacturing precision
If substrates are bonded to carrier plates to prevent bowing, then substrate flatness is improved, but processing time increases due to additional bonding and debonding steps
Solution Approach 1:
The patent replaces the chemical bonding mechanism (adhesive bonding to carrier plates) with a mechanical clamping system. The deposition ring portions are raised to engage and clamp the substrate edges, providing the necessary mechanical support to prevent bowing without requiring bonding chemicals or additional bonding/debonding process steps
3Loss of time
If substrates are mechanically clamped to flatten them, then processing time is reduced, but substrate contact may cause sticking or plasma arcing
Solution Approach 1:
The deposition ring portions are configured to contact only specific localized regions of the substrate (at predetermined radial positions), rather than covering the entire substrate surface. This localized engagement provides sufficient mechanical support to prevent bowing while minimizing the contact area, thereby reducing the risk of substrate sticking and plasma arcing
Data Source
AI summary
Embodiments of process kits for use in a process chamber are provided herein. In some embodiments, a process kit for use in a process chamber includes: a deposition ring including a first portion having an first inner ledge and a second portion having a second inner ledge, wherein in a first position, the first portion is spaced from the second portion, and wherein in a second position, the second portion is configured to engage the first portion so that the first inner ledge is aligned with the second inner ledge along a common plane to form a clamping surface.


