Organic EL Panel Defect Repair via Laser Surface Roughening
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Solution Overview
Problem
Conventional methods for repairing defects in organic EL panels, such as those involving laser CVD or transfer of metal films, are costly, time-consuming, and ineffective for small defects, leading to luminance reductions and poor panel quality.
Innovation Solution
Roughening the exposed surface of the TFT panel at defects using a laser beam with a wavelength of 400 nm or less, allowing the formation of an organic functional layer and counter electrode without repairing the defects, thereby minimizing luminance reductions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional repair methods (laser CVD, metal film transfer) are used to repair defective interconnects, then the defects can be repaired, but the production cost increases and the repair time is extended
Solution Approach 1:
The patent extracts and removes the defective interconnect portion entirely, then forms a new interconnect layer that bypasses the defect. This eliminates the need for complex repair processes like laser CVD or metal film transfer, thereby maintaining high reliability while significantly improving production speed and reducing costs.
Solution Approach 2:
The patent segments the interconnect repair process into two distinct stages: first forming an undercoat layer to prepare the surface, then forming the new interconnect layer. This segmentation allows each layer to be optimized independently, ensuring reliable defect coverage while maintaining a simple, fast manufacturing process.
2Reliability
If conventional repair methods (laser CVD, metal film transfer) are used to repair defective interconnects, then the defects can be repaired, but the production cost increases
Solution Approach 1:
The patent removes the defective portion and replaces it with a newly formed interconnect layer, avoiding the need for expensive specialized equipment like laser CVD apparatus or metal film transfer apparatus. This approach maintains reliable defect repair while dramatically reducing manufacturing costs and simplifying the production process.
Solution Approach 2:
The patent uses a cost-effective undercoat layer material (such as organic resin) that can be easily deposited using standard coating equipment rather than expensive metal film transfer processes. This disposable undercoat layer provides sufficient functionality for defect coverage while being much cheaper to manufacture.
3Reliability
If conventional repair methods are used for small defects (20 μm or less), then repair may be achieved, but foreign substance contamination occurs and repair uniformity is poor
Solution Approach 1:
The patent extracts and removes the defective interconnect material completely, then forms a fresh undercoat layer followed by a new interconnect layer. This complete removal and reformation approach ensures uniform repair quality for small defects without the foreign substance contamination issues associated with laser CVD or metal film transfer methods.
Solution Approach 2:
The patent changes the material parameter of the undercoat layer to use organic resin or similar materials that can be uniformly deposited by standard coating processes. This parameter change enables precise, uniform repair of small defects (20 μm or less) without the contamination and non-uniformity problems of conventional methods.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This method enables rapid and cost-effective reduction of luminance unevenness at defects, improving the quality of organic EL panels by avoiding the need for expensive equipment and complex repair processes.
Implementation Method 1
roughening a portion of the surface of the TFT panel by applying a laser beam onto the portion
Implementation Method 2
applying a laser beam onto the portion, the portion including a surface exposed through a defect
Data Source
AI summary
A local luminance reduction at defects in pixel electrodes with a rapid and easy method is achieved by providing a method of manufacturing an organic EL panel that includes a TFT panel and organic EL devices disposed over a surface of the TFT panel in matrix arrangement, each of the organic EL devices including: a pixel electrode disposed over the surface of the TFT panel, an organic luminescent layer disposed over the pixel electrode; and a counter electrode disposed over the organic functional layer.