Elastic Wave Package Structure for Moisture-Resistant Sealing

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Solution Overview

Problem

Elastic wave devices with a multilayer film and piezoelectric thin film on a support substrate are prone to moisture penetration, which can affect their characteristics due to gaps between the insulating layer and support layer.

Innovation Solution

The design includes a support substrate with a piezoelectric thin film, interdigital transducer electrodes, wiring layers, an insulating layer, a spacer layer, and a cover, where the insulating layer surrounds the piezoelectric thin film and has a sloping region that increases the distance between its outer and inner edges, enhancing moisture resistance by preventing water penetration.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a flat insulating layer is used to surround the piezoelectric thin film, then the device structure is simple and easy to manufacture, but moisture can penetrate through the interface between the insulating layer and spacer layer, reducing device reliability

Engineering Contradiction:
Improvemoisture resistanceVSAvoidinsulating layer structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The insulating layer is designed with a sloping region instead of a flat surface, creating an inclined interface with the spacer layer. This curvature changes the geometry from a horizontal interface to an angled one, preventing moisture from easily penetrating along the interface and improving the seal between layers.

Inventive Principle:
Principle #14Spheroidality (Curvature)

Solution Approach 2:

The insulating layer has different structural characteristics in different regions: a flat region for general coverage and a sloping region specifically at the interface with the spacer layer. This local variation in structure provides enhanced moisture resistance where it is most needed while maintaining simplicity in other areas.

Inventive Principle:
Principle #3Local quality

2Reliability

If the insulating layer is made thicker to prevent moisture penetration, then moisture resistance improves, but the device height increases and manufacturing complexity increases

Engineering Contradiction:
Improvemoisture resistanceVSAvoiddevice height
Core Design Contradiction:
ReliabilityVSLength of stationary object

Solution Approach 1:

By introducing a sloping region, the insulating layer creates an angled barrier that moisture must traverse. This geometric approach provides enhanced moisture resistance without requiring a proportional increase in the overall thickness of the insulating layer, thus controlling device height.

Inventive Principle:
Principle #14Spheroidality (Curvature)

Solution Approach 2:

Instead of increasing moisture resistance solely by adding thickness in the vertical dimension, the invention introduces a sloping angle, utilizing the angular dimension to create a more effective moisture barrier. This allows for improved protection without a linear increase in device height.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration improves the moisture resistance and reliability of the elastic wave device by creating an airtight environment, reducing the likelihood of water reaching the IDT electrodes and minimizing the height from the support substrate to the cover.

Implementation Method 1

a piezoelectric thin film (122)

Methodology Applied
Scientific EffectPiezoelectric effect: Piezoelectric Effect

Data Source

PatentUS11677378B2Elastic wave device
Publication Date: 2023.06.13 MURATA MFG CO LTD
  • US11677378B2 patent drawing
  • US11677378B2 patent drawing
  • US11677378B2 patent drawing

AI summary

An elastic wave device includes a piezoelectric thin film, IDT electrodes on the piezoelectric thin film, an insulating layer surrounding the piezoelectric thin film on a primary surface of a support substrate, a spacer layer surrounding the piezoelectric thin film in plan view, and a cover on the spacer layer. The spacer layer includes an outer edge and an inner edge closer than the outer edge to the piezoelectric thin film in plan view. The primary surface of the insulating layer closer to the spacer layer includes a sloping region that extends where the insulating layer overlaps the spacer layer in plan view and in which the distance from the first primary surface of the support substrate along the direction perpendicular or substantially perpendicular to the support substrate increases from the outer edge toward the inner edge.