Electroless Metallization Stack for Corrosion-Resistant Solder Contacts

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Solution Overview

Problem

Existing solder contact technologies for electronic devices lack significant improvements, particularly in the metallization processes, leading to inefficiencies and potential issues with corrosion and compatibility with various substrates.

Innovation Solution

The method involves electrolessly depositing a barrier metal and a substantially gold-free wetting layer with solder wettability on substrates, using reducing agents like borane to avoid the formation of black pads and incorporating materials such as nickel, cobalt, or iron alloys, which are corrosion-resistant and suitable for various substrates.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If traditional metallization processes are used for solder contacts, then manufacturing simplicity is maintained, but corrosion resistance and solder wettability are insufficient

Engineering Contradiction:
Improvecorrosion resistanceVSAvoidmetallization process complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The metallization structure is segmented into multiple functional layers: a barrier metal layer (nickel, cobalt, or their alloys) for corrosion resistance and substrate protection, and a separate wetting layer (tin, lead-free solder alloys, or their combinations) for solder wettability. This segmentation allows each layer to optimize its specific function without compromising the other, resolving the contradiction between corrosion resistance and process simplicity.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent employs composite metallization structures combining different metal materials with complementary properties. The barrier metal layer provides corrosion resistance while the wetting layer provides solder compatibility. This composite approach enables simultaneous achievement of corrosion resistance and solder wettability, addressing the technical contradiction between reliability and process complexity.

Inventive Principle:
Principle #40Composite materials

2Reliability

If gold-containing wetting layers are used, then solder wettability is achieved, but cost increases and black pad formation risk increases

Engineering Contradiction:
Improvesolder wettabilityVSAvoidprecious metal usage
Core Design Contradiction:
ReliabilityVSLoss of substance

Solution Approach 1:

The patent replaces expensive gold-containing wetting layers with cost-effective alternative materials such as tin, lead-free solder alloys (Sn-Ag, Sn-Cu, Sn-Zn), or their combinations. These cheaper materials provide adequate solder wettability without the high cost and black pad formation risks associated with gold, directly addressing the contradiction between solder wettability and precious metal usage.

Inventive Principle:
Principle #27Cheap short-living objects (Disposable)

Solution Approach 2:

The patent changes the material composition parameters of the wetting layer by eliminating gold and using alternative metals with different chemical and physical properties. This parameter change maintains solder wettability while reducing costs and preventing black pad formation, resolving the contradiction between reliability and loss of substance.

Inventive Principle:
Principle #35Parameter changes

3Manufacturing precision

If electroless deposition is used for barrier metal, then uniform coverage is achieved, but deposition speed decreases

Engineering Contradiction:
Improvecoverage uniformityVSAvoiddeposition speed
Core Design Contradiction:
Manufacturing precisionVSProductivity

Solution Approach 1:

The deposition process is segmented into two distinct stages: first, electroless deposition of the barrier metal layer to achieve uniform coverage and corrosion protection; second, electroless deposition of the wetting layer to achieve solder compatibility. This segmentation allows optimization of each deposition stage for its specific purpose, maintaining coverage uniformity while managing overall deposition speed through process optimization.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent optimizes deposition parameters such as bath composition, temperature, pH, and deposition time for each layer to balance coverage uniformity and deposition speed. By adjusting these parameters, the electroless deposition process achieves both uniform barrier metal coverage and adequate deposition rates, resolving the contradiction between manufacturing precision and productivity.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enhances the reliability and durability of solder contacts by ensuring strong solder wetting and corrosion prevention, improving the overall performance and longevity of electronic devices.

Implementation Method 1

electrolessly depositing a barrier metal at least on portions of the substrate; and using wet chemistry such as electroless deposition to deposit a substantially gold-free wetting layer

Methodology Applied
Scientific EffectElectroless deposition: Chemical Beam Epitaxy

Implementation Method 2

using reducing agents like borane to avoid the formation of black pads

Methodology Applied
Scientific EffectChemical reduction: Reduction

Implementation Method 3

deposit a substantially gold-free wetting layer having solder wettability onto the barrier metal

Methodology Applied
Scientific EffectWetting: Wetting

Data Source

PatentUS9006893B2Devices for metallization
Publication Date: 2015.04.14 LAM RES CORP
  • US9006893B2 patent drawing
  • US9006893B2 patent drawing
  • US9006893B2 patent drawing

AI summary

An electronic device which in one embodiment comprises a metallization stack is provided. The metallization stack comprises a barrier metal deposited electrolessly and a substantially gold-free wetting layer deposited electrolessly. Additionally, the barrier metal contacts the wetting layer, where the wetting layer is wettable by solder.