Electromagnetic Wave Detecting Element Charge Trapping Suppression
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Solution Overview
Problem
Existing electromagnetic wave detecting elements suffer from charge trapping in the semiconductor layer, leading to residual image formation, which is not adequately suppressed by existing technologies.
Innovation Solution
The electromagnetic wave detecting element features a design with collection electrodes that cover at least a portion of the longitudinal and entire lateral region of adjacent scan or signal lines, ensuring charges are collected rather than trapped, with a second insulation film layer and thin film transistors strategically positioned to enhance charge collection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a conventional electromagnetic wave detecting element structure is used, then the device can detect electromagnetic waves and generate charges, but a portion of the generated charges are trapped in the semiconductor layer causing residual image formation
Solution Approach 1:
The collection electrode is divided into multiple segments: a first collection electrode positioned at a first position and a second collection electrode positioned at a second position different from the first position. This segmentation allows charges to be collected at multiple locations within the semiconductor layer, preventing charge trapping and residual image formation while maintaining effective charge collection efficiency
Solution Approach 2:
The invention introduces a spatial dimension by positioning collection electrodes at different positions (first position and second position) within the semiconductor layer. This multi-position arrangement creates additional charge collection pathways in different spatial locations, effectively eliminating charge trapping that occurs in conventional single-position structures
2Object-generated harmful factors
If collection electrodes are positioned to cover scan lines and signal lines, then charge trapping is suppressed, but device complexity increases due to additional insulation films and electrode arrangements
Solution Approach 1:
The collection electrodes serve multiple functions: they collect charges generated in the semiconductor layer, suppress charge trapping, and are positioned to cover scan lines and signal lines. By making the collection electrode structure multi-functional, the invention reduces the need for separate components while achieving multiple objectives, thereby managing device complexity
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This design effectively suppresses charge trapping in the semiconductor layer, reducing residual images and improving image quality by ensuring charges are collected by the electrodes rather than being trapped, as demonstrated by a reduction in residual image intensity from 0.2 mR to 0.04 mR.
Implementation Method 1
a semiconductor layer 6, which generates charges when irradiated with predetermined electromagnetic waves
Implementation Method 2
plurality of collection electrodes, which collects generated charges
Data Source
AI summary
The present invention is to provide an electromagnetic wave detecting element that can suppress the trapping of charges in a semiconductor layer. Plural lower electrodes, which collect charges generated in the semiconductor layer, are each provided to cover at least a portion in a length direction and the entire region in a width direction of a scan line adjacent thereto, and the lower electrodes are disposed at positions at which the scan lines are provided.