Electron Microscope Sample Holder for Simultaneous Optical Probing
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Solution Overview
Problem
Current electron microscopy systems lack the capability for simultaneous structural and optical characterization of nanostructured materials due to space constraints in the sample holder, which prevents the simultaneous application and measurement of electrical potentials and currents with high spatial resolution.
Innovation Solution
An electron microscope sample holder arrangement that integrates optical measurement technology, allowing for simultaneous optical measurements with scanning probe techniques, including a sample holder positioned in the electron beam path, an optical input device to receive light from the sample, and a light guiding system for directing light to the sample, enabling simultaneous structural and optical characterization.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If optical measurement technology is integrated into the electron microscope sample holder, then simultaneous structural and optical characterization is enabled, but the device complexity increases
Solution Approach 1:
The patent combines optical measurement capabilities (light source, optical fiber, detector) with the electron microscope sample holder into a single integrated system. This merging allows simultaneous structural characterization via electron microscopy and optical characterization via light interaction, enabling comprehensive material analysis without requiring separate experimental setups
Solution Approach 2:
The sample holder is designed to perform multiple functions: it serves as a positioning platform for the sample, an electron beam support for structural imaging, and an optical measurement platform for light interaction studies. This multi-functionality allows a single device to replace what would traditionally require multiple separate instruments
2Adaptability or versatility
If optical components are added to the sample holder, then optical measurements become possible, but the space available for other components is reduced
Solution Approach 1:
The optical components are nested within the existing sample holder structure. The light source, optical fiber, and detector are arranged in a compact configuration that utilizes the vertical and lateral spaces already present in the sample holder design, allowing optical measurement capabilities to be added without requiring additional horizontal space that would interfere with electron beam access
3Adaptability or versatility
If the sample holder is designed for simultaneous optical and electron microscopy, then comprehensive characterization is enabled, but the ease of manufacture decreases
Solution Approach 1:
The sample holder is designed as a modular system with distinct functional segments: an electron beam support structure, an optical component assembly, and a control system. Each segment can be manufactured and tested independently before final assembly, reducing the overall manufacturing complexity while maintaining the capability for simultaneous optical and electron microscopy
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables comprehensive characterization of material properties by allowing for simultaneous high-resolution imaging and optical measurements, increasing the number of measurement possibilities and analysis capabilities.
Implementation Method 1
an optical fiber (7) arranged to transmit light from a light source (3) to a sample (11)
Implementation Method 2
an optical detector (4) arranged to receive light from the sample (11)
Data Source
Figure 1A~1B
Figure 2
Figure 3
AI summary
The present invention relates to an optical arrangement and in particular to an optical arrangement for use in electron microscopy applications. This is used for sample characterization with simultaneous measurement with the electron microscopy of the sample and measurements with an optical setup and/or using a manipulator for probing of a light source or a scanning probe device.