A two-member manipulator grips and releases lamellae inside a charged particle microscope, avoiding welding damage and cutting transfer time.
A pressing and guide mechanism lets a precision linear actuator release on collision and automatically return, avoiding break-element replacement.
Selective shuttered vacuum nozzles transfer functional micrometric devices while blocking defective units that cause black spots.
Individually shuttered suction nozzles transfer functional micrometric devices while leaving defective ones behind, improving yield and throughput.
Charged particle beams create gradient forces to capture, position, rotate, heat, and join nanoscale objects without physical contact.
A deformable pick-up head uses optical or capacitive force sensing to control µLED transfer force and improve placement accuracy.
Linear spring oscillation is converted into wheel-platform rotation, helping sub-millimetric micromotors overcome drag in viscous media.