Selective Suction Nozzle Array for Micrometric Device Transfer
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Solution Overview
Problem
Current methods for transferring micrometric electronic devices, such as light-emitting diodes, are inefficient due to the inability to selectively transfer functional devices while avoiding defective ones, leading to increased costs and manufacturing complexity, particularly in the context of luminous display screens and microelectronics.
Innovation Solution
A manipulation system comprising a suction chamber, suction nozzles, shutter elements, and displacement actuators that allow selective gripping and release of micrometric devices through controlled suction and actuation, enabling precise transfer of functional devices while leaving defective ones behind.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If compression or thermocompression transfer is used to transfer a large quantity of light-emitting diodes, then the transfer speed and productivity are improved, but defective devices are transferred along with functional ones, reducing the reliability of the final product
Solution Approach 1:
The patent divides the transfer process into individual nozzle-level operations, where each nozzle can independently select and transfer single light-emitting diodes. This segmentation allows functional devices to be identified and transferred separately from defective ones, resolving the contradiction between mass transfer speed and defect rate by enabling selective picking at high speed through parallel nozzle operations.
Solution Approach 2:
The patent applies different suction pressures to different nozzles based on local conditions. Each nozzle can be individually controlled to apply suction only when a functional light-emitting diode is detected, allowing the system to maintain high overall productivity while ensuring only functional devices are transferred, thus improving reliability without sacrificing transfer speed.
2Reliability
If individual pick and place method is used to transfer light-emitting diodes, then the reliability of transfer is improved by selecting only functional devices, but the transfer speed and productivity deteriorate significantly
Solution Approach 1:
The patent merges the advantages of individual selection with mass transfer by combining multiple nozzles into a single array system. Each nozzle maintains individual control for selective picking, while the collective array operates in parallel to achieve high transfer speeds, thus resolving the contradiction between selection accuracy and transfer speed through spatial multiplication of selective units.
Solution Approach 2:
The nozzle array system serves multiple functions simultaneously: it can perform individual selective picking, mass transfer, and adaptive pressure control all through a single integrated system. This multi-functionality allows the system to achieve both high reliability through selective transfer and high productivity through parallel operations, eliminating the need to choose between the two opposing requirements.
3Reliability
If repair or replacement of defective light-emitting diodes is performed, then the reliability of the final product is improved, but the manufacturing complexity and cost increase
Solution Approach 1:
The patent performs preliminary selection of functional light-emitting diodes during the transfer process itself, before final placement on the display screen. By using individually controllable nozzles to pick only functional devices, the system prevents defective devices from reaching the final product, thereby improving reliability without requiring subsequent repair steps and reducing manufacturing complexity.
4Reliability
If redundancy areas are created by adding functional diodes near defective ones, then the reliability of the final product is improved, but the manufacturing cost and device complexity increase
Solution Approach 1:
The patent extracts defective light-emitting diodes from the transfer process by using individually controllable nozzles to select and transfer only functional devices. By taking out the defective devices before they can cause problems in the final product, the system improves reliability without needing to add redundancy areas or extra functional diodes, thereby avoiding increased device complexity and manufacturing cost.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution enables efficient and selective transfer of micrometric devices, reducing the number of defective devices on the final substrate, thereby minimizing costs and improving manufacturing efficiency by allowing for the selective handling of functional devices.
Implementation Method 1
a suction channel (33) emerging on the one hand towards the suction chamber (13) at a suction opening (35), and on the other hand at a gripping end (37) intended to be brought into contact with a micrometric device (3)
Data Source
AI summary
A manipulation system intended to manipulate micrometric devices, the manipulation system including a main body internally delimiting a suction chamber, suction nozzles including a suction channel emerging on the one hand towards the suction chamber, and on the other hand at a gripping end intended to be brought into contact with a micrometric device; shutter elements, configured to shut off a suction nozzle so as to prevent the gripping of a micrometric device or to allow a fluid communication between a gripping opening of the gripping end and the suction chamber, so as to allow the gripping of a micrometric device in contact with said gripping end. A manipulation method for manipulating micrometric devices by such a manipulation system.