Nanoscale Micro Assembly Using Charged Particle Beam Manipulation
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Solution Overview
Problem
Current methods lack an effective technology for the precise manipulation of nanoscale objects, which is crucial for advancements in physics, chemistry, and biology.
Innovation Solution
The use of charged particle beams, such as electron beams, to create a non-uniform charge distribution, forming a gradient force that allows for high-precision manipulation of tiny objects in three-dimensional space, including rotation, positioning, and connection of nanoscale objects.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If optical tweezers are used to manipulate microscopic particles, then particles can be captured and manipulated, but the method cannot effectively manipulate nanoscale objects due to size limitations
Solution Approach 1:
The patent replaces optical fields with charged particle beams (electron or ion beams) to manipulate tiny objects. The charged particle beam system uses electromagnetic fields to generate gradient forces that can capture and manipulate objects at the nanoscale, overcoming the size limitation of optical tweezers while achieving high-precision manipulation.
2Adaptability or versatility
If acoustic tweezers are used to capture particles, then particles greater than a few hundred nanometers can be manipulated, but smaller nanoscale objects cannot be effectively captured
Solution Approach 1:
The patent changes the physical parameters of the manipulation field by using charged particle beams with adjustable energy and charge density. This allows the gradient force to be tuned to effectively capture and manipulate objects across a wide size range from hundreds of nanometers down to molecular scales, achieving both broad adaptability and high precision.
3Manufacturing precision
If charged particle beams are used to manipulate nanoscale objects, then high-precision manipulation is achieved, but complex control of position, orientation, and connection requires sophisticated adjustment mechanisms
Solution Approach 1:
The patent makes the charged particle beam system multi-functional by using the same beam for multiple purposes: capturing objects via gradient force, moving objects by beam scanning, heating objects through energy deposition, and irradiating objects for chemical reactions. This universal approach reduces device complexity while achieving high-precision manipulation and assembly.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables 4D high-precision manipulation of nanoscale objects without physical contact, facilitating complex operations and promoting progress in various scientific fields like physics, chemistry, and biology.
Implementation Method 1
using one or more charged particle beams to move a first tiny object... According to the method, the one or more charged particle beams capture the first tiny object by using a gradient force formed by a non-uniform charge distribution
Implementation Method 2
The method further includes heating the first tiny object and the second tiny object
Implementation Method 3
The method further includes irradiating the first tiny object and the second tiny object; enabling the first tiny object and the second tiny object to undergo a chemical reaction
Data Source
AI summary
The present invention relates to a micro device fabricating method, including providing two or more tiny objects; using one or more charged particle beams to move a first tiny object and enable the first tiny object to come into contact with a second tiny object; and connecting the first tiny object and the second tiny object. The present invention extends micro device fabricating to a nanoscale.