Electrostatic Chuck Edge Curvature for Particle and Discharge Control
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Solution Overview
Problem
The enlargement of the electrostatic adsorption electrode in electrostatic chuck members leads to a decrease in adsorption force uniformity across the wafer surface, increasing the likelihood of charged foreign particles being electrostatically adsorbed to the side surfaces, which causes abnormal discharge and reduces productivity.
Innovation Solution
The electrostatic chuck member features a side peripheral surface with a first and second curved surface in the circumferential direction, an inclined surface between them, and specific curvature radii to disperse the electrostatic field, reducing the attachment of charged foreign particles.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If the electrostatic adsorption electrode is enlarged, then the adsorption force uniformity across the wafer surface is improved, but the field intensity at the side surface increases causing more charged foreign particles to be electrostatically adsorbed
Solution Approach 1:
The side peripheral surface is designed with a curved shape instead of a flat surface. The curvature radius is specifically set to be 0.5 mm to 5 mm to disperse the electrostatic field concentration at the side surface, reducing the attachment of charged foreign particles while maintaining the enlarged electrode area for uniform adsorption.
Solution Approach 2:
The curvature radius of the side peripheral surface is optimized within a specific range (0.5 mm to 5 mm) to control the electrostatic field distribution. This parameter change allows the electrode to maintain both large area for uniform adsorption and reduced field intensity at the side surface to minimize particle attachment.
2Area of stationary object
If the electrostatic adsorption electrode is enlarged, then the processing area is increased, but the distance between the side surface and the electrode decreases increasing field intensity
Solution Approach 1:
By curving the side peripheral surface with a specific radius (0.5 mm to 5 mm), the geometry is modified to reduce electric field concentration at the side surface while preserving the enlarged electrode area, thus maintaining both large processing area and reduced field intensity.
3Ease of manufacture
If an inclined portion is provided in the periphery to improve plasma cleaning effect, then the cleaning effectiveness is improved, but the attachment of charged foreign particles to the side surface during manufacturing process is not suppressed
Solution Approach 1:
The curved side peripheral surface with optimized curvature radius (0.5 mm to 5 mm) provides both effective plasma cleaning access and reduced electrostatic field concentration, simultaneously achieving cleaning effectiveness and suppression of charged particle attachment during processing.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This design effectively suppresses the attachment of charged foreign particles and abnormal discharge, enhancing semiconductor chip yield and productivity by dispersing the electrostatic field and reducing the surface area for particle attachment.
Implementation Method 1
an electrostatic adsorption electrode which is provided on a side opposite to the placement surface or in the base body
Implementation Method 2
a side peripheral surface which is continuous to the placement surface in the base body includes at least a first curved surface which is a convex surface and is provided in a circumferential direction in a peripheral portion of the placement surface
Data Source
AI summary
An electrostatic chuck member includes: a base body wherein one main surface thereof is a placement surface on which a plate-shaped sample is placed; and an electrostatic adsorption electrode provided on a side opposite to the placement surface or in the base body, in which a side peripheral surface that is continuous to the placement surface in the base body includes at least a first curved surface that is a convex surface and is provided in a circumferential direction in a peripheral portion of the placement surface and a second curved surface that is provided in the circumferential direction at a different height position from the first curved surface.


