Electromigration Check Schematic Design Iteration
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Solution Overview
Problem
Current integrated circuit design processes are time-consuming due to the need for multiple iterations of layout modification and electromigration (EM) checks, particularly as the number of electronic components increases, leading to inefficiencies in EM compliance verification.
Innovation Solution
Incorporating an electromigration check process before layout design generation, which involves selecting circuits for EM check, evaluating compliance, and mitigating identified violations through design modifications, thereby reducing the number of post-layout EM sign-off checks and improving design throughput.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If multiple iterations of layout modification and electromigration checks are performed, then electromigration compliance is improved, but design time is increased
Solution Approach 1:
The patent performs electromigration checks during the schematic design phase before layout generation, identifying and mitigating EM violations early when the design is still flexible. This preliminary action prevents the need for multiple iterative corrections later in the design process, thereby reducing overall design time while maintaining compliance.
Solution Approach 2:
The patent implements a feedback mechanism where EM check results are fed back into the design process to guide layout modifications. By continuously monitoring EM compliance and adjusting designs based on check results, the process achieves compliance more efficiently without requiring numerous redundant iterations.
2Adaptability or versatility
If the number of electronic components is increased, then circuit functionality is improved, but electromigration check complexity is increased
Solution Approach 1:
The patent segments the electromigration check process into manageable components, analyzing each circuit element and connection separately. This segmentation allows the complexity of checking numerous components to be broken down into systematic, manageable tasks, maintaining thoroughness while improving process efficiency.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach reduces the overall time required for generating layout designs that meet electromigration compliance, thereby enhancing the efficiency and speed of the integrated circuit design process.
Implementation Method 1
Current passing through conductive lines induces electromigration (EM), i.e., the movement of the metal atoms resulting from momentum transfer between the electrons passing through the conductive lines and the metal atoms comprising the conductive lines
Data Source
AI summary
A method includes conducting an electromigration (EM) check process on a schematic design, conducting a mitigating process to mitigate one or more electromigration violations identified during conducting the EM check process, and generating a layout design of the schematic design after at least one iteration of a design process including the EM check process and the mitigating process. The EM check process includes selecting at least some circuits in the schematic design as selected circuits for electromigration check, and checking electromigration compliance in the selected circuits. The mitigating process includes modifying the schematic design.