Embedded Test Processor for In-Field IC Defect Repair
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Solution Overview
Problem
Conventional methods for ensuring reliability of programmable integrated circuits are inadequate as they do not allow for in-field defect identification and repair, leading to system downtime and potential device damage during manual handling and transport when failures occur.
Innovation Solution
Incorporating a smart test processor, such as a secure device manager, within the integrated circuit to perform self-diagnostic testing and selective in-field repair, enabling defect detection and repair at the customer site without requiring return to the factory.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If conventional factory screening methods are used to ensure reliability, then manufacturing precision is improved, but loss of time increases due to system downtime when failures occur in the field
Solution Approach 1:
The patent implements self-diagnostic testing capability within the integrated circuit that can proactively detect defects before they cause system failure. The test processor continuously or periodically executes diagnostic routines to identify potential issues with logic circuitry, configuration memory, or interconnects, allowing for early intervention and repair scheduling that minimizes system downtime.
Solution Approach 2:
The integrated circuit includes an embedded test processor that can autonomously perform self-diagnostic testing without requiring external test equipment. The device can identify its own defects, generate diagnostic data, and even initiate repair processes independently, eliminating the need for system removal and external factory testing that causes downtime.
2Reliability
If manual handling and transport of suspecting failing units to the factory is performed, then reliability assessment is improved, but device damage risk increases
Solution Approach 1:
The integrated circuit autonomously performs self-diagnostic testing and generates comprehensive defect diagnostic data without requiring physical removal from the system. The embedded test processor can identify and characterize defects in logic circuitry, configuration memory, and interconnects while the device remains installed, eliminating all handling and transport risks.
Solution Approach 2:
The patent introduces an embedded test processor as an intermediary component within the integrated circuit that mediates between the device and external testing systems. This on-chip test processor can communicate diagnostic data through existing system interfaces, allowing remote defect assessment without physical device movement.
3Loss of time
If in-field self-diagnostic testing and selective repair capability is implemented, then loss of time is reduced, but device complexity increases
Solution Approach 1:
The embedded test processor is designed as a multi-functional component that can perform multiple diagnostic functions across different parts of the integrated circuit. It can test logic circuitry, configuration memory, and interconnects using a unified testing architecture, reducing the need for separate dedicated test circuits for each component type.
Solution Approach 2:
The patent combines the test processor, diagnostic logic, and repair control functions into a single integrated unit within the device. The self-diagnostic capability is merged with the existing programmable logic and configuration memory structures, allowing defect detection and repair initiation without adding completely separate testing subsystems.
Data Source
AI summary
An integrated circuit may include an embedded test processor that is capable of performing in-field testing and repair of hardware-related defects without having to remove the integrated circuit from the customer's board. The test processor can be used to drive and monitor test vectors to performing defect screening on input-output circuitry, logic circuitry including lookup table (LUT) circuits and digital signal processing (DSP) circuits, transceiver circuitry, and configuration random-access memory circuitry. The test processor can generate a failure mechanism report and selectively fix repairable defects via a hardware redundancy scheme. The failure mechanism report allows the customer to identify the root cause of failure in the overall system.