Configurable Embedded Tester for Multi-Protocol Circuit Verification
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Solution Overview
Problem
Existing embedded testers lack the flexibility and efficiency to test component circuitry of devices using multiple communication protocols and require complex setup processes, limiting their ability to dynamically adapt to different testing scenarios.
Innovation Solution
A configurable embedded tester is implemented with firmware that includes protocol and pattern generators, a system controller, and test ports, allowing for dynamic selection and generation of test patterns and protocols, as well as adjustable clocking information, to effectively test component circuitry across various protocols and devices.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If existing embedded testers are used to test component circuitry, then testing can be performed, but the testers lack flexibility and efficiency when dealing with multiple communication protocols
Solution Approach 1:
The embedded tester is designed with configurable protocol generators and pattern generators that can be programmed to support multiple communication protocols (I2C, SPI, UART, etc.). The logic device can be reconfigured via firmware to become a miniature universal tester capable of testing different device types and protocols, making the tester adaptable to various testing scenarios without requiring multiple dedicated testers.
Solution Approach 2:
The tester employs dynamic reconfiguration capabilities where the logic device can switch between mission-mode firmware and test firmware. The protocol generators and pattern generators are configurable at runtime, allowing the tester to adapt its behavior dynamically based on the specific testing requirements. This dynamic nature enables the same hardware to efficiently handle different protocols and device types.
2Productivity
If existing embedded testers are used to test component circuitry, then testing can be performed, but the setup processes are complex and time-consuming
Solution Approach 1:
The tester includes pre-configurable protocol generators and pattern generators that can be programmed in advance with the required testing parameters. The logic device can be pre-configured with the appropriate firmware before testing begins. This preliminary configuration reduces the actual setup time during testing operations, as the basic testing framework is already in place and ready to be customized for specific devices.
Solution Approach 2:
The embedded tester allows for parameter configuration through firmware that can be loaded and changed without hardware modifications. The protocol generators and pattern generators accept configurable parameters that can be adjusted via software control, enabling quick adaptation to different testing scenarios. This parameter-based configuration approach significantly reduces setup time compared to hardwired or fixed-function testers.
3Adaptability or versatility
If the logic is reconfigured for testing, then the device can be tested, but the mission mode firmware must be overwritten and then reverted
Solution Approach 1:
The logic device is designed to dynamically switch between mission-mode firmware and test firmware. This reconfiguration capability allows the same logic resources to serve dual purposes: normal device operation and embedded testing. The ability to load different firmware images and reconfigure the logic on-the-fly provides the adaptability needed for versatile testing while maintaining the original device functionality when testing is complete.
Solution Approach 2:
The testing process involves temporarily discarding the mission-mode firmware configuration, performing the necessary tests, and then recovering or restoring the original mission-mode firmware. This approach allows the embedded tester to utilize the full capabilities of the logic device for testing purposes while ensuring that the device returns to its operational state after testing. The firmware can be stored in non-volatile memory and reloaded as needed.
Data Source
AI summary
A tester on a device under test to test component circuitry of the device under test, the tester comprising: logic configured with firmware to implement test circuitry comprising: protocol generators that are configurable to generate protocols; pattern generators that are configurable to provide test patterns that are drivable according to one or more of the protocols; and a system controller to select, in response to a program input, a test pattern and a protocol with which to test the component circuitry.