Embedded Wiring Semiconductor Package Structure
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Solution Overview
Problem
Conventional semiconductor package structures, such as QFP and BGA, face limitations in I/O connections, profile thickness, signal transmission, fabricating complexity, delamination, and thermal expansion coefficient mismatch due to multi-layered carriers and complex wiring arrangements.
Innovation Solution
A single-layered semiconductor package structure with a wiring layer embedded in an insulative layer, where one side is coupled to electronic components and the other to soldering balls, reducing signal path length and interfaces, and using a single material for the insulative layer to prevent warpage.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If a multi-layered carrier with complex wiring arrangement is used, then the number of I/O connections can be increased, but the device complexity and fabrication difficulty increase
Solution Approach 1:
The patent divides the wiring function into separate segments: the carrier body provides mechanical support while discrete wiring layers are added independently. This allows I/O connections to be increased through additional wiring layers without complicating the base carrier structure, as each wiring layer can be fabricated and attached separately
Solution Approach 2:
The patent transitions from planar wiring arrangements to three-dimensional stacked wiring layers. By adding wiring layers in the vertical dimension rather than expanding horizontally, the number of I/O connections increases while maintaining a compact footprint and avoiding increased carrier complexity
2Quantity of substance
If a multi-layered carrier with conductive pillars is used, then high I/O connections can be achieved, but the profile thickness increases
Solution Approach 1:
The patent nests multiple wiring layers within a compact vertical stack, with each wiring layer containing I/O connections. This nesting approach allows high I/O connectivity while maintaining a low profile thickness, as the wiring layers are tightly integrated rather than stacked with large spacing
Solution Approach 2:
The patent uses thin film wiring layers with flexible interconnections that can be bent and routed efficiently. This allows the wiring to achieve high I/O connections without requiring thick rigid structures, maintaining a low profile thickness through flexible thin-film construction
3Quantity of substance
If multiple wiring layers and conductive pillars are fabricated, then high I/O connections are achieved, but the signal transmission path becomes too long
Solution Approach 1:
The patent inverts the conventional approach by routing signals through the carrier body itself rather than through long external paths. The carrier is designed with embedded conductive pathways that provide direct signal transmission between wiring layers, shortening the signal path while maintaining high I/O connectivity
4Quantity of substance
If a hybrid carrier with multiple layers of different materials is used, then high I/O connections can be achieved, but delamination and warpage increase
Solution Approach 1:
The patent uses a carrier body made of a single homogeneous material with uniform thermal expansion properties. This homogeneity prevents internal stress and delamination that would occur with hybrid multi-material carriers, while still achieving high I/O connections through the stacked wiring layer architecture
Solution Approach 2:
The patent introduces different materials locally at the wiring layer interfaces rather than throughout the entire carrier structure. The carrier body remains homogeneous, while localized adhesive or interface layers are added only where needed for wiring attachment, minimizing material mismatches and preventing warpage
Data Source
AI summary
A semiconductor package is provided and includes: an insulative layer having opposing first and second surfaces; a wiring layer embedded in the insulative layer and having a first side that is exposed from the first surface of the insulative layer and a second side opposing the first side and attached to the second surface of the insulative layer; at least one electronic component mounted on the second side of the wiring layer and electrically connected to the wiring layer; and an encapsulating layer formed on the second side of the wiring layer and the second surface of the insulative layer and encapsulating the electronic component. Therefore, the single wiring layer is allowed to be connected to the electronic component on one side and connected to solder balls on the other side thereof to shorten the signal transmission path.


