Embossing Device Inert Atmosphere Gas Inclusion Control

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Solution Overview

Problem

Existing embossing methods for producing structures in the nanometer and micron range often suffer from gas inclusions in photoresist due to ambient air and solvent escape, leading to faults in high-resolution substrates.

Innovation Solution

A device and method that establish a defined atmosphere within the embossing process, using controlled gas pressure to minimize gas inclusions, preferably in a vacuum environment with reduced oxygen content, and precise application of structure material to prevent foreign material inclusions and optimize embossing processes.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of operation

If embossing is performed in ambient air atmosphere, then the embossing process can be carried out under normal conditions, but gas inclusions form in the photoresist due to trapped air and solvent escape

Engineering Contradiction:
Improveembossing process simplicityVSAvoidstructure quality
Core Design Contradiction:
Ease of operationVSManufacturing precision

Solution Approach 1:

The patent applies an inert atmosphere (vacuum or controlled gas environment) within the embossing device to eliminate ambient air. This prevents gas inclusions in the photoresist by removing the source of trapped air bubbles while maintaining ease of operation through automated atmosphere control systems.

Inventive Principle:
Principle #39Inert atmosphere (Inert environment)

2Manufacturing precision

If high resolution structures are produced in the nanometer range, then structure quality is improved, but gas inclusions from ambient air and solvent escape become more problematic

Engineering Contradiction:
Improvestructure resolutionVSAvoidgas inclusions
Core Design Contradiction:
Manufacturing precisionVSObject-affected harmful factors

Solution Approach 1:

The inert atmosphere eliminates ambient air that would otherwise be trapped during high-resolution embossing, preventing gas inclusions that would compromise nanometer-scale structure quality.

Inventive Principle:
Principle #39Inert atmosphere (Inert environment)

Solution Approach 2:

The patent changes the atmospheric parameters (pressure, gas composition) within the embossing environment to optimize the embossing process for high-resolution structures while preventing gas inclusion formation.

Inventive Principle:
Principle #35Parameter changes

3Manufacturing precision

If defined atmosphere control is implemented, then foreign material inclusions are reduced, but device complexity increases due to additional atmosphere control means

Engineering Contradiction:
Improveforeign material inclusion reductionVSAvoidatmosphere control system
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent implements a controlled inert atmosphere using vacuum or gas flow systems that, while adding complexity, dramatically reduce foreign material inclusions and enable high-resolution embossing.

Inventive Principle:
Principle #39Inert atmosphere (Inert environment)

Solution Approach 2:

The atmosphere control system acts as an intermediary between the ambient environment and the embossing process, filtering out harmful contaminants while maintaining process simplicity through automated control.

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Significantly reduces foreign material inclusions, enabling high-resolution structures with minimized processing time and uniform residual layer thickness, particularly effective for nanostructures on large substrates.

Implementation Method 1

the defined atmosphere is essentially free of gases or is provided with a very low gas concentration compared to the atmosphere surrounding the working space, even more preferably there being no ambient air in the working space. This can be achieved for example in the form of a vacuum with a pressure

Methodology Applied
Scientific EffectVacuum: Vacuum

Data Source

PatentUS10239253B2Method for embossing of substrates
Publication Date: 2019.03.26 EV GRP E THALLNER GMBH
  • US10239253B2 patent drawing
  • US10239253B2 patent drawing

AI summary

A method for embossing a structure material on a substrate disposed within a device having side walls, a base plate and a cover that define a working space that is isolated from a surrounding environment. The method includes the steps of: a) moving the substrate using a first calibration means and aligning the substrate with an application means, b) applying the structure material to the substrate, c) moving the substrate using a second calibration means that is located at least partially in the working space wherein the substrate is disposed within the working space and is aligned with an embossing means that is located at least partially in the working space, and d) embossing the structure material on the substrate while the substrate is in the working space using the embossing means, wherein the working space has a defined atmosphere, before and during the step of embossing, without interruption.