EMI Simulation Accuracy via Power Supply Model
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Solution Overview
Problem
Current manufacturing methods for electronic devices face challenges in accurately simulating Electro Magnetic Interference (EMI) due to low accuracy in estimating in-IC power supply current, leading to increased time and cost in EMI certification testing and component selection, especially with higher IC integration levels.
Innovation Solution
A manufacturing method that involves preparing power supply models with impedance information, measuring power supply noise, calculating in-IC power supply current, and simulating EMI characteristics to improve the accuracy of EMI simulations, thereby reducing the need for trial manufacturing and optimizing EMI countermeasure component selection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If EMI simulation is performed using power supply current inside the IC, then accuracy of EMI simulation is improved, but time required for simulation increases with higher degree of integration
Solution Approach 1:
The patent creates a power supply model in advance that includes impedance information on the power supply path. This preliminary model allows for rapid calculation of in-IC power supply current during EMI simulations without requiring time-consuming measurements or complex computations each time a simulation is needed. The model is prepared beforehand to enable quick and accurate EMI assessments.
Solution Approach 2:
The patent introduces a power supply model as an intermediary element that bridges the gap between the physical power supply path and the EMI simulation requirements. This model includes impedance information and serves as a mediator that enables accurate current calculation without direct measurement, thus improving simulation accuracy while maintaining efficiency.
2Measurement precision
If EMI simulation is performed for every change of program installed in the IC, then accuracy of EMI assessment is improved, but manufacturing cost and time increase
Solution Approach 1:
The power supply model is created in advance during the design phase, before manufacturing and programming. This preliminary preparation allows multiple EMI simulations to be performed efficiently for different programs without incurring additional manufacturing costs or time, as the model can be reused repeatedly for different simulation scenarios.
Solution Approach 2:
The patent creates a simplified electrical model (a copy or representation) of the actual power supply path inside the IC. This model can be used repeatedly for multiple EMI simulations with different programs without requiring physical modifications or remanufacturing, thus enabling accurate assessment while maintaining ease of manufacture.
3Ease of manufacture
If in-IC power supply current is estimated with low accuracy, then manufacturing process is simpler, but EMI simulation accuracy deteriorates
Solution Approach 1:
The power supply model acts as an intermediary that enables accurate current calculation without complex manufacturing processes. By incorporating impedance information into the model, the system achieves high EMI simulation accuracy through calculation rather than through complex physical measurements or manufacturing procedures.
Solution Approach 2:
The patent replaces the need for complex physical measurements and trial manufacturing processes with an electrical model-based calculation system. Instead of physically measuring currents or performing repeated manufacturing trials, the system uses the power supply model with impedance information to calculate and predict EMI characteristics accurately.
Data Source
AI summary
Accuracy of an EMI simulation is improved. A manufacturing method of an electronic device is a manufacturing method of an electronic device including a substrate and a semiconductor device mounted on the substrate. The manufacturing method of the electronic device includes a step (a) of preparing a power supply model including impedance information on a power supply path included in the electronic device, a step (b) of measuring a power supply noise at the time of operation of the electronic device, a step (c) of calculating a power supply current inside the semiconductor device, based on the power supply noise and the power supply model, and a step (d) of simulating EMI (Electro Magnetic Interference) characteristics, based on the power supply current and the power supply model.