Energy-Dependent Filter for X-ray Analysis Micro-Region Control

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Solution Overview

Problem

Existing X-ray fluorescence analysis methods struggle to irradiate only a small, specific region of a sample, leading to potential damage and inefficiency, particularly in the semiconductor industry where precise analysis is required.

Innovation Solution

An energy-dependent filter is placed in the optical path between the X-ray tube and the sample, selecting X-rays based on predetermined energy values to control the dimensions of the irradiated micro-region, combined with a capillary lens for focused X-ray beam generation and a detector for fluorescence detection.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If conventional X-ray analysis methods are used without energy-dependent filtering, then the X-ray beam can penetrate the sample effectively, but the irradiated region becomes larger than desired and diffraction peaks interfere with analysis accuracy

Engineering Contradiction:
Improveirradiated region dimensionsVSAvoidanalysis reliability
Core Design Contradiction:
Manufacturing precisionVSReliability

Solution Approach 1:

The patent applies parameter changes by introducing an energy-dependent filter that selectively transmits X-rays based on their energy levels. This filter modifies the energy distribution of the X-ray beam, allowing only specific energy ranges to reach the sample, thereby controlling the irradiated region size and eliminating diffraction peaks that would otherwise interfere with analysis

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The energy-dependent filter serves as an intermediary component placed between the X-ray source and the sample. This mediator selectively filters the X-ray beam by absorbing certain energy levels while transmitting others, thus controlling both the spatial dimensions of the irradiated region and the energy composition to eliminate harmful diffraction effects

Inventive Principle:
Principle #24Intermediary (Mediator)

2Object-affected harmful factors

If the X-ray beam is focused to a smaller micro-region, then surrounding electronics remain nonirradiated and damage risk is reduced, but the analysis reliability decreases due to diffraction peaks

Engineering Contradiction:
ImproveX-ray damage to surrounding electronicsVSAvoidanalysis reliability
Core Design Contradiction:
Object-affected harmful factorsVSReliability

Solution Approach 1:

By changing the energy parameters of the X-ray beam through selective filtering, the patent achieves precise spatial control of the irradiated micro-region. The energy-dependent filter ensures that only X-rays with appropriate energy levels reach the sample, maintaining a small irradiated area while simultaneously eliminating diffraction peaks that would compromise analysis reliability

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent converts the potentially harmful effect of diffraction peaks into a benefit by using energy-dependent filtering to eliminate these peaks. The filter transforms the broad-spectrum X-ray beam into a selectively filtered beam that avoids the energy ranges producing diffraction, thereby turning a source of analysis error into a means of improving measurement accuracy

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This method allows for precise control of the irradiated region, minimizing damage and improving analysis reliability by eliminating diffraction peaks and optimizing the spot size, making it suitable for semiconductor analysis.

Implementation Method 1

selecting the energy-dependent filter (3) which is adapted to block in considerable measure X-rays with an energy which is equal to or lower than a predetermined energy value

Methodology Applied
Scientific EffectX-ray absorption: Absorption (EM radiation)

Implementation Method 2

at least one capillary lens for focusing the X-rays in a micro-region at a location for a sample for analysis

Methodology Applied
Scientific EffectX-ray focusing: Focusing

Implementation Method 3

analysis of X-ray fluorescence originating from a relatively small irradiated region of a sample

Methodology Applied
Scientific EffectX-ray fluorescence: Fluorescence

Data Source

PatentEP1750118B1Method for performing x-ray analysis
Publication Date: 2013.03.27 PANALYTICAL BV
  • EP1750118B1 patent drawingFigure 1
  • EP1750118B1 patent drawingFigure 2A~2B
  • EP1750118B1 patent drawing

AI summary

The invention relates to a device for performing X-ray analysis. Device 1 comprises an X-ray tube 2 and at least one capillary lens 4 for focusing the X-rays in a micro-region at a location 5 for a sample for analysis. Device 1 further comprises a detector 6 for detecting X-ray fluorescence from the sample. Device 1 further comprises at least one energy-dependent filter 3 placed between the X-ray tube 2 and the capillary lens 4. The filter 3 is adapted to substantially block X-rays with an energy which is lower than a predetermined threshold value.