Material Analysis Using Wave/Particle Radiation TRIZ Cases
- Electron-Beam Deflection Calibration Using 1D Diffraction Grating
Segmenting calibration into perpendicular and parallel axes using a 1D grating resolves pitch arrangement errors that degrade measurement precision.
- X-ray Fluorescence Measurement Automation via Optical Recognition
Automated optical recognition aligns X-ray fluorescence measurements, eliminating manual positioning bottlenecks.
- Non-Intrusive Cargo Inspection via Elemental Signature Verification
Nuclear resonance fluorescence imaging detects tampering by comparing elemental signatures against stored references.
- Charged Particle Optics Adjustment via Spot Pattern Analysis
A control unit adjusts charged particle optics by forming and analyzing multiple spot patterns to select optimal input values.
- X-ray Fluorescence Lithological Layer Identification
X-ray fluorescence spectroscopy analyzes inorganic elements across multiple specimen surfaces to determine mass concentrations for rapid lithological classification.
- Pattern Measuring Device Using Reference Position Alignment
A pattern measuring device sets reference positions using SEM images and design data to evaluate geometric deviations.
- Adaptive XRF Analysis for Mixed Material Composition
Automated x-ray fluorescence analysis adjusts beam energy and filtration based on spectral data to categorize samples as metal or non-metal.
- Ion Beam Sample Preparation for Crystalline Structure Analysis
Heavy ion beams prepare samples without damaging crystalline structures, enabling accurate analysis via electron backscatter detection.
- Proppant Analysis Correction via SEM Calibration
SEM analysis determines correction factors to resolve imaging subjectivity in proppant logs.
- Infrared Lens Unit Tilt Error Suppression via Cutout Adhesive Bonding
A lens unit uses cutout parts to introduce adhesive between lenses for secure integration.
- Electron Beam Inspection Overlap Correction for Defect Detection
An electron beam inspection apparatus corrects overlap region brightness using stored coefficients to maintain image accuracy during multi-beam scanning.
- Porous Nitrocellulose Microarray Imager Using Quantum Nanoparticles
Porous nitrocellulose substrate paired with quantum nanoparticle fluorophores amplifies fluorescent signal brightness, reducing bulky scanning equipment costs.
- Energy-Dependent Filter for X-ray Analysis Micro-Region Control
An energy-dependent filter selects X-ray energies to define the irradiated micro-region size.
- Atmosphere Isolation Sample Holder for FIB-SEM Transfer
A sample exchanger with a lid mechanism isolates the specimen during transfer between analytical chambers.
- Charged Particle Beam Illumination Setting via Reference Image Simulation
A charged particle beam apparatus generates reference images showing signal generation ranges to assist users in setting illumination conditions.
- Coded Markers for X-ray System Position Measurement
Dense coded markers on imaging components resolve limited measurement accuracy by establishing a robust reference point network.
- Electron Beam Control Using Pulse Width Modulation
Pulse width modulation modulates electron beam duty cycle to resolve slow filament heating response times in CT imaging systems.
- 3D Rock Imaging Segmentation for Reservoir Property Prediction
Segmenting 3D rock images into compositional classes predicts effective material properties from a single sample.
- X-ray Imaging Device with Dynamic Flux Modulation
Movable attenuators in the beam path locally adjust X-ray intensity to prevent overexposure and underexposure across varying tissue absorption.
- Automated Insect Monitoring System with Sensor Fusion
Automated insect detection replaces manual counting with sensor fusion to distinguish marked from wild populations for precise sterile release monitoring.
- X-ray Shield Placement for ADC Chip Protection in CT Detectors
Shielding protects sensitive ADC chips from X-ray exposure while enabling tileable detector modules for multi-slice CT systems.
- CT System Functional Monitoring via Measurement Scatter Analysis
Computer tomography system monitors functional state by calculating scatter measures of measured variables from multiple workpiece measurements.