Epoxy Resin Composition for Semiconductor Encapsulation

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Solution Overview

Problem

Existing epoxy resin compositions for encapsulating semiconductor devices face challenges in achieving high storage stability, low curing shrinkage, and efficient curing at desired temperatures, which affect the reliability and productivity of semiconductor packaging.

Innovation Solution

An epoxy resin composition incorporating a phosphonium compound as a curing catalyst, combined with an inorganic filler and a silicon compound, which includes specific chemical formulations to optimize curing properties, such as the phosphonium compound represented by Formula 4 and silicon compound represented by Formula 7, to enhance curing efficiency and storage stability.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Temperature

If conventional curing catalysts are used in epoxy resin compositions, then curing can proceed at desired temperatures, but storage stability deteriorates due to premature curing reactions

Engineering Contradiction:
Improvecuring temperatureVSAvoidstorage stability
Core Design Contradiction:
TemperatureVSStability of the object's composition

Solution Approach 1:

The patent uses a silane-modified epoxy resin as an intermediary component that reacts with the curing catalyst to form a stable complex during storage, preventing premature curing. Upon heating to the desired curing temperature, this complex decomposes to release the active catalyst, enabling controlled curing initiation. This intermediary mechanism resolves the contradiction between maintaining storage stability and enabling temperature-controlled curing.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent modifies the chemical parameters of the epoxy resin by introducing silane groups, which change the reactivity profile of the system. The silane-modified epoxy resin exhibits temperature-dependent reactivity, remaining stable at low temperatures (storage conditions) but becoming highly reactive at elevated temperatures (curing conditions). This parameter change enables the resin to maintain storage stability while allowing efficient curing at desired temperatures.

Inventive Principle:
Principle #35Parameter changes

2Reliability

If conventional epoxy resin compositions are used, then basic encapsulation can be achieved, but curing shrinkage increases affecting device reliability

Engineering Contradiction:
Improvedevice reliabilityVSAvoidcuring shrinkage
Core Design Contradiction:
ReliabilityVSLoss of substance

Solution Approach 1:

The patent employs a composite epoxy resin system combining silane-modified epoxy resin with conventional epoxy resin and inorganic fillers. The silane-modified component provides low shrinkage characteristics while the inorganic fillers further reduce overall shrinkage. This composite material approach maintains device reliability by minimizing curing shrinkage-induced stress and deformation.

Inventive Principle:
Principle #40Composite materials

Solution Approach 2:

The patent introduces silane modification at specific molecular locations within the epoxy resin structure, creating local regions with enhanced properties. The silane groups are positioned to participate in crosslinking reactions that produce lower shrinkage locally, which collectively reduces overall curing shrinkage of the encapsulant while maintaining bulk material properties.

Inventive Principle:
Principle #3Local quality

3Productivity

If standard epoxy resin compositions are used, then mass production is feasible, but productivity decreases due to insufficient curing efficiency

Engineering Contradiction:
Improvecuring efficiencyVSAvoidmass production suitability
Core Design Contradiction:
ProductivityVSEase of manufacture

Solution Approach 1:

The patent optimizes the chemical composition parameters of the epoxy resin system, specifically the ratio of silane-modified epoxy resin to conventional epoxy resin and the type/amount of curing catalyst. These parameter optimizations enable faster curing kinetics at lower temperatures, improving curing efficiency and productivity while maintaining compatibility with existing mass production transfer molding processes.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent replaces reliance on high mechanical energy input (high temperature/pressure) for curing with a chemically optimized system that achieves efficient curing at lower temperatures through improved molecular reactivity. The silane-modified epoxy resin and optimized catalyst system enable curing to proceed more rapidly and completely under milder conditions, enhancing productivity without requiring additional mechanical energy input.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The composition achieves high storage stability, low curing shrinkage, and efficient curing at desired temperatures, ensuring high reliability and flowability, thereby improving the encapsulation of semiconductor devices.

Implementation Method 1

the curing catalyst includes a phosphonium compound represented by the following Formula 4

Methodology Applied
Scientific EffectCatalysis: Catalysis

Implementation Method 2

an epoxy resin and a curing agent

Methodology Applied
Scientific EffectChemical Bonding: Chemical Bonding

Data Source

PatentUS9870971B2Epoxy resin composition for encapsulating a semiconductor device and semiconductor device prepared using the same
Publication Date: 2018.01.16 SAMSUNG SDI CO LTD
  • US9870971B2 patent drawing
  • US9870971B2 patent drawing
  • US9870971B2 patent drawing

AI summary

An epoxy resin composition and a semiconductor device, the composition including an epoxy resin; a curing agent; an inorganic filler; a curing catalyst; and a silicon compound, wherein the curing catalyst includes a phosphonium compound represented by the following Formula 4 and the silicon compound comprises a silicon compound represented by the following Formula 7: