Eye Opening Measurement Circuit for High-Speed Serial Receiver

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Solution Overview

Problem

In high-speed serial link systems, it is challenging to measure the eye diagram of a signal equalized by the receiver's equalizer, as the equalized signal is internally processed and cannot be probed, necessitating a technology to assess the eye opening and equalization quality within the receiver.

Innovation Solution

An eye opening measurement circuit that tracks minimum and maximum sigma levels, calculates their difference, and adjusts the equalizer coefficients to improve signal quality, enabling effective compensation for channel losses and noise within the receiver.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If the equalized signal is internally processed in the receiver, then the signal quality is improved through equalization, but the ability to measure the eye diagram is lost

Engineering Contradiction:
Improvesignal qualityVSAvoideye diagram measurement
Core Design Contradiction:
ReliabilityVSDifficulty of detecting and measuring

Solution Approach 1:

The patent introduces an eye opening measurement circuit as an intermediary component that receives the equalized signal from the equalizer and performs measurement without disrupting the internal processing. This mediator enables eye diagram measurement while the signal continues to be processed internally for communication, resolving the contradiction between signal quality improvement and measurement capability

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The measurement function is segmented from the main signal processing path. The eye opening measurement circuit operates as a separate functional block that samples and measures the equalized signal independently, allowing both the equalization process and measurement process to occur simultaneously without interfering with each other

Inventive Principle:
Principle #1Segmentation

2Measurement precision

If the eye opening measurement circuit tracks sigma levels step-by-step, then the measurement precision is improved, but the circuit complexity increases

Engineering Contradiction:
Improveeye opening measurement precisionVSAvoidmeasurement circuit complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent employs dynamic tracking of sigma levels where the measurement circuit adaptively adjusts its operation based on the incoming signal characteristics. The circuit dynamically updates the eye opening measurement by comparing current signal levels with reference levels, enabling precise measurement without requiring a fixed, complex structure

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The eye opening measurement circuit uses the signal itself to perform the measurement by comparing voltage levels against reference levels derived from the signal distribution. The circuit self-calibrates by identifying the voltage levels corresponding to different logical values and calculating the eye opening based on these self-determined reference points, reducing the need for external calibration equipment

Inventive Principle:
Principle #25Self-service

Data Source

PatentUS10809297B2Eye opening measurement circuit calculating difference between sigma levels, receiver including the same, and method for measuring eye opening
Publication Date: 2020.10.20 SAMSUNG ELECTRONICS CO LTD
  • US10809297B2 patent drawing
  • US10809297B2 patent drawing
  • US10809297B2 patent drawing

AI summary

A receiver includes a sampler that samples first voltage levels corresponding to a first logical value of data and second voltage levels corresponding to a second logical value of the data, based on a sampling clock. An equalizer receives and adjusts the first and second voltage levels. A clock and data recovery circuit recovers the sampling clock, based on the first and second voltage levels from the equalizer. An eye opening measurement circuit: (1) tracks a first sigma level by a first step unit depending on upper voltage levels greater than a first reference voltage level among the first voltage levels, (2) tracks a second sigma level by a second step unit depending on lower voltage levels less than a second reference voltage level among the second voltage levels, and (3) calculates a difference between the first sigma level and the second sigma level.